Copper ECD process control by means of electroanalysis combined with multiway data decomposition chemometric techniques

ECS Transactions

Volumn 6, Issue 19, 2007, Pages 39-52

  Jaworski, A ^a   Wikiel, H ^a   Wikiel, K ^a  

^a YesTech Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; DESIGN OF EXPERIMENTS; ELECTROCHEMICAL ELECTRODES; ELECTROCHEMICAL SENSORS; LEAST SQUARES APPROXIMATIONS; REGRESSION ANALYSIS; SIGNAL TO NOISE RATIO; VOLTAMMETRY;

CHEMOMETRIC TECHNIQUES; EXTRACTING INFORMATION; LATENT FACTOR ANALYSIS; LEAST SQUARES REGRESSION; MULTIVARIATE REGRESSION; ON-LINE MONITORING SYSTEM; PARTIAL LEAST SQUARE (PLS); VOLTAMMETRIC TECHNIQUES;

CHEMICAL ANALYSIS;

EID: 55849089928     PISSN: 19385862     EISSN: 19386737     Source Type: Conference Proceeding    
DOI: 10.1149/1.2831728     Document Type: Conference Paper

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