Structure, morphology and magnetization of Fe-Pd thin films

Journal of Nanoscience and Nanotechnology

Volumn 8, Issue 8, 2008, Pages 4238-4242

  Rout, S ^a   Kumar, M Senthil ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY BOMBAY   (India)

Author keywords

Morphology; Remanence ratio; Twin variants

Indexed keywords

APPLIED MAGNETIC FIELDS; ATOMIC FORCES; ATOMIC RADIUSES; COERCIVITY; GRAIN SIZES; LATTICE SPACINGS; MAGNETIZATION MEASUREMENTS; NANOMETER SIZES; PD THIN FILMS; REMANENCE RATIO; REMANENCE RATIOS; SCANNING ELECTRON MICROSCOPY IMAGES; SHAPE MEMORIES; TWIN VARIANTS; X-RAY DIFFRACTIONS;

ATOMIC PHYSICS; ATOMS; IRON COMPOUNDS; MAGNETIC FIELDS; MAGNETIC PROPERTIES; MAGNETIZATION; MAGNETS; MICROSCOPIC EXAMINATION; PALLADIUM; REMANENCE; SATURATION MAGNETIZATION; SURFACE ROUGHNESS; THICK FILMS; THIN FILMS;

MAGNETIC THIN FILMS;

EID: 55849088430     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2008.AN54     Document Type: Conference Paper

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