Precise measurements of BAW and SAW properties of langasite in the temperature range from 25°C to 1000°C

2008 IEEE International Frequency Control Symposium, FCS

Volumn , Issue , 2008, Pages 326-331

  Bardong, J ^a,c   Schulz, M ^b   Schmitt, M ^a   Shrena, I ^a   Eisele, D ^a   Mayer, E ^a   Reindl, L M ^a   Fritze, H ^b  

^a UNIVERSITY OF FREIBURG   (Germany)

^b CLAUSTHAL UNIVERSITY OF TECHNOLOGY   (Germany)

^c CTR CARINTHIAN TECH RESEARCH AG   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC IMPEDANCE; ACOUSTIC SURFACE WAVE FILTERS; ACOUSTIC WAVE VELOCITY; ACOUSTIC WAVES; ACOUSTICS; CARBON DIOXIDE ARC WELDING; ELASTIC WAVES; ELECTRIC CURRENTS; ELECTROMECHANICAL DEVICES; GALLIUM; INDUSTRIAL APPLICATIONS; LANTHANUM; MELTING POINT; NUMERICAL ANALYSIS; PHASE TRANSITIONS; PHASE VELOCITY; PIEZOELECTRICITY; PLATINUM; RESONANCE; SAWING; SENSORS; SILICON; SILICON COMPOUNDS; SINGLE CRYSTALS; STOICHIOMETRY; TENSORS; THERMOCHEMISTRY; ZIRCONIUM;

ADHESION LAYERS; ANTIRESONANCE; BULK ACOUSTIC WAVES; COUPLING COEFFICIENTS; DIFFERENT HEIGHTS; ELECTROMECHANICAL PARAMETERS; EULER ANGLES; HARSH ENVIRONMENTS; HIGH TEMPERATURES; LANGASITE; MATERIAL PARAMETERS; PHYSICAL MODELS; PIEZOELECTRIC PROPERTIES; PIEZOELECTRIC SINGLE CRYSTALS; PIEZOELECTRIC TENSORS; PLATINUMLAYER; PRECISE MEASUREMENTS; PROMISING MATERIALS; PROPAGATION LOSSES; RESONATOR GEOMETRIES; SAW DEVICES; SAW PROPERTIES; SENSOR FILMS; SURFACE ACOUSTIC WAVE DEVICES; TEMPERATURE RANGES; THERMOGRAVIMETRY; WIRELESS SENSING;

ACOUSTIC SURFACE WAVE DEVICES;

EID: 55749086003     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/FREQ.2008.4623013     Document Type: Conference Paper

References (23)

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