Multiscale entropy complexity analysis of metallic interconnection electromigration noise

Wuli Xuebao/Acta Physica Sinica

Volumn 57, Issue 10, 2008, Pages 6545-6550

  He, Liang ^a   Du, Lei ^a   Zhuang, Yi Qi ^a   Li, Wei Hua ^a   Chen, Jian Ping ^a  

^a XIDIAN UNIVERSITY   (China)

Author keywords

Complexity; Electromigration; MSE; Noise

Indexed keywords

EID: 55649124910     PISSN: 10003290     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (14)