-
1
-
-
0001867992
-
-
Shipway, A. N.; Katz, E.; Willner, I. ChemPhysChem 2000, 1, 18.
-
(2000)
ChemPhysChem
, vol.1
, pp. 18
-
-
Shipway, A.N.1
Katz, E.2
Willner, I.3
-
4
-
-
10944273665
-
-
(a) Cheng, W.; Dong, S.; Wang, E. J. Phys. Chem. B 2004, 108, 19146.
-
(2004)
J. Phys. Chem. B
, vol.108
, pp. 19146
-
-
Cheng, W.1
Dong, S.2
Wang, E.3
-
5
-
-
0034225565
-
-
(b) Shipway, A. N.; Lahav, M.; Willner, I. Adv. Mater. 2000, 12, 993.
-
(2000)
Adv. Mater
, vol.12
, pp. 993
-
-
Shipway, A.N.1
Lahav, M.2
Willner, I.3
-
6
-
-
2642561781
-
-
(c) Liu, S.; Maoz, R.; Sagiv, J. Nano Lett. 2004, 4, 845.
-
(2004)
Nano Lett
, vol.4
, pp. 845
-
-
Liu, S.1
Maoz, R.2
Sagiv, J.3
-
7
-
-
3943079378
-
-
Sato, T.; Hasko, D. G.; Ahmed, H. J. Vac. Sci. Technol. B 1997, 15, 45.
-
(d) Sato, T.; Hasko, D. G.; Ahmed, H. J. Vac. Sci. Technol. B 1997, 15, 45.
-
-
-
-
8
-
-
33748573640
-
-
(e) Chen, C.-F.; Tzeng, S.-D.; Lin, M.-H.; Gwo, S. Langmuir 2006, 22, 7819.
-
(2006)
Langmuir
, vol.22
, pp. 7819
-
-
Chen, C.-F.1
Tzeng, S.-D.2
Lin, M.-H.3
Gwo, S.4
-
9
-
-
42449164721
-
-
Khatri, O. P.; Murase, K.; Sugimura, H. Langmuir 2008, 24, 3787.
-
(2008)
Langmuir
, vol.24
, pp. 3787
-
-
Khatri, O.P.1
Murase, K.2
Sugimura, H.3
-
11
-
-
0242382678
-
-
(a) Nakao, H.; Shiigi, H.; Yamamoto, Y.; Tokonami, S.; Nagaoka, T.; Sugiyama, S.; Ohtani, T. Nano Lett. 2003, 3, 1391.
-
(2003)
Nano Lett
, vol.3
, pp. 1391
-
-
Nakao, H.1
Shiigi, H.2
Yamamoto, Y.3
Tokonami, S.4
Nagaoka, T.5
Sugiyama, S.6
Ohtani, T.7
-
12
-
-
20644466231
-
-
(b) Deng, Z.; Tian, Y.; Lee, S.-H.; Ribbe, A. E.; Mao, C. Angew. Chem., Int. Ed. 2005, 44, 3582.
-
(2005)
Angew. Chem., Int. Ed
, vol.44
, pp. 3582
-
-
Deng, Z.1
Tian, Y.2
Lee, S.-H.3
Ribbe, A.E.4
Mao, C.5
-
13
-
-
34648843307
-
-
(c) Sainsbury, T.; Ikuno, T.; Okawa, D.; Facile, D.; Frechst, J. M. J.; Zettl, A. J. Phys. Chem. C2007, 111, 12992.
-
(2007)
J. Phys. Chem. C
, vol.111
, pp. 12992
-
-
Sainsbury, T.1
Ikuno, T.2
Okawa, D.3
Facile, D.4
Frechst, J.M.J.5
Zettl, A.6
-
14
-
-
26944489065
-
-
(d) Kim, G.-M.; Wutzler, A.; Radusch, H.-J.; Michler, G. H.; Simon, P.; Sperling, R. A.; Parak, W. J. Chem. Mater. 2005, 17, 4949.
-
(2005)
Chem. Mater
, vol.17
, pp. 4949
-
-
Kim, G.-M.1
Wutzler, A.2
Radusch, H.-J.3
Michler, G.H.4
Simon, P.5
Sperling, R.A.6
Parak, W.J.7
-
15
-
-
0035655263
-
-
(e) Sawitowski, T.; Miquel, Y.; Heilmann, A.; Schmid, G. Adv. Funct. Mater. 2001, 11, 435.
-
(2001)
Adv. Funct. Mater
, vol.11
, pp. 435
-
-
Sawitowski, T.1
Miquel, Y.2
Heilmann, A.3
Schmid, G.4
-
16
-
-
33744969849
-
-
Corbierre, M. K.; Beerens, J.; Beauvais, J.; Lennox, R. B. Chem. Mater. 2006, 18, 2628.
-
(2006)
Chem. Mater
, vol.18
, pp. 2628
-
-
Corbierre, M.K.1
Beerens, J.2
Beauvais, J.3
Lennox, R.B.4
-
17
-
-
33750511093
-
-
Dahinaus, D.; Franzka, S.; Hasselbrink, E.; Hartmann, N. Nano Lett. 2006, 6, 2358.
-
(2006)
Nano Lett
, vol.6
, pp. 2358
-
-
Dahinaus, D.1
Franzka, S.2
Hasselbrink, E.3
Hartmann, N.4
-
18
-
-
0037531078
-
-
Liu, S.; Maoz, R.; Schmid, G.; Sagiv, J. Nano Lett. 2002, 2, 1055.
-
(2002)
Nano Lett
, vol.2
, pp. 1055
-
-
Liu, S.1
Maoz, R.2
Schmid, G.3
Sagiv, J.4
-
20
-
-
14544282825
-
-
Ling, X.; Zhu, X.; Zhang, J.; Zhu, T.; Liu, M.; Tong, L.; Liu, Z. J. Phys. Chem. B 2005, 109, 2657.
-
(2005)
J. Phys. Chem. B
, vol.109
, pp. 2657
-
-
Ling, X.1
Zhu, X.2
Zhang, J.3
Zhu, T.4
Liu, M.5
Tong, L.6
Liu, Z.7
-
21
-
-
33646502626
-
-
Tzeng, S.-D.; Lin, K.-J.; Hu, J.-C; Chen, L.-J.; Gwo, S. Adv. Mater. 2006, 18, 1147.
-
(2006)
Adv. Mater
, vol.18
, pp. 1147
-
-
Tzeng, S.-D.1
Lin, K.-J.2
Hu, J.-C.3
Chen, L.-J.4
Gwo, S.5
-
22
-
-
0034188114
-
-
Zheng, J.; Zhu, Z.; Chen, H.; Liu, Z. Langmuir 2000, 16, 4409.
-
(2000)
Langmuir
, vol.16
, pp. 4409
-
-
Zheng, J.1
Zhu, Z.2
Chen, H.3
Liu, Z.4
-
23
-
-
64549110913
-
-
Bhushan, B, Fuchs, H, Tomitori, M, Eds, Springer-Verlag: New York, Chapter 33, p
-
Sugimura, H. Scanning Probe Anodization for Nanopatterning; Applied Scanning Probe Methods X: Biomimetics and Industrial Applications; Bhushan, B., Fuchs, H., Tomitori, M., Eds.; Springer-Verlag: New York, 2008; Chapter 33, p 217.
-
(2008)
Scanning Probe Anodization for Nanopatterning; Applied Scanning Probe Methods X: Biomimetics and Industrial Applications
, pp. 217
-
-
Sugimura, H.1
-
24
-
-
0037018431
-
-
(a) Sugimura, H.; Hanji, T.; Hayashi, K.; Takai, O. Adv. Mater. 2002, 14, 524.
-
(2002)
Adv. Mater
, vol.14
, pp. 524
-
-
Sugimura, H.1
Hanji, T.2
Hayashi, K.3
Takai, O.4
-
25
-
-
33847083996
-
-
(b) Lee, W.-K.; Chen, S.; Chilkoti, A.; Zauscher, S. Small 2007, 3, 249.
-
(2007)
Small
, vol.3
, pp. 249
-
-
Lee, W.-K.1
Chen, S.2
Chilkoti, A.3
Zauscher, S.4
-
27
-
-
33645215493
-
-
(d) Sugimura, H.; Uchida, T.; Kitamura, N.; Masuhara, H. J. Phys. Chem. 1994, 98, 4352.
-
(1994)
J. Phys. Chem
, vol.98
, pp. 4352
-
-
Sugimura, H.1
Uchida, T.2
Kitamura, N.3
Masuhara, H.4
-
28
-
-
79956036802
-
-
Ara, M.; Graaf, H.; Tada, H. App. Phys. Lett. 2002, 80, 2565.
-
(2002)
App. Phys. Lett
, vol.80
, pp. 2565
-
-
Ara, M.1
Graaf, H.2
Tada, H.3
-
29
-
-
33745453627
-
-
Yang, M.; Zheng, Z.; Liu, Y.; Zhang, B. J. Phys. Chem. B 2006, 110, 10365.
-
(2006)
J. Phys. Chem. B
, vol.110
, pp. 10365
-
-
Yang, M.1
Zheng, Z.2
Liu, Y.3
Zhang, B.4
-
30
-
-
5844422033
-
-
(a) Servat, J.; Gorostiza, P.; Sanz, F.; Perez-Murano, F.; Barniol, N.; Abadal, G.; Aymerich, X. J. Vac. Sci. Technol. A 1996, 14, 1208.
-
(1996)
J. Vac. Sci. Technol. A
, vol.14
, pp. 1208
-
-
Servat, J.1
Gorostiza, P.2
Sanz, F.3
Perez-Murano, F.4
Barniol, N.5
Abadal, G.6
Aymerich, X.7
-
31
-
-
0032607946
-
-
(b) Garcia, R.; Calleja, M.; Rohrer, H. J. Appl. Phys. 1999, 86, 1898.
-
(1999)
J. Appl. Phys
, vol.86
, pp. 1898
-
-
Garcia, R.1
Calleja, M.2
Rohrer, H.3
-
32
-
-
0032069968
-
-
(c) Garcia, R.; Calleja, M.; Perez-Murano, F. Appl. Phys. Lett. 1998, 72, 2295.
-
(1998)
Appl. Phys. Lett
, vol.72
, pp. 2295
-
-
Garcia, R.1
Calleja, M.2
Perez-Murano, F.3
-
33
-
-
33644690381
-
-
(d) Kuramochi, H.; Ando, K.; Tokizaki, T.; Yokoyama, H. Appl. Phys. Lett. 2006, 88, 093109.
-
(2006)
Appl. Phys. Lett
, vol.88
, pp. 093109
-
-
Kuramochi, H.1
Ando, K.2
Tokizaki, T.3
Yokoyama, H.4
-
35
-
-
55149098345
-
-
Sano, H.; Maeda, H.; Matsuoka, S.; Lee, K.-H.; Murase, K.; Sugimura, H. Jpn. J. Appl Phys. 2008, 47, 5659.
-
(2008)
Jpn. J. Appl Phys
, vol.47
, pp. 5659
-
-
Sano, H.1
Maeda, H.2
Matsuoka, S.3
Lee, K.-H.4
Murase, K.5
Sugimura, H.6
-
36
-
-
3042814908
-
-
Nihonyanagi, S.; Miyamoto, D.; Idojiri, S.; Uosaki, K. J. Am. Chem. Soc. 2004, 726, 7034.
-
(2004)
J. Am. Chem. Soc
, vol.726
, pp. 7034
-
-
Nihonyanagi, S.1
Miyamoto, D.2
Idojiri, S.3
Uosaki, K.4
-
37
-
-
4544320383
-
-
Kuramochi, H.; Ando, K.; Tokizaki, T.; Yasutake, M.; Perez-Murano, F.; Dagata, J. A.; Yokoyama, H. Surf. Sci. 2004, 566-568, 343.
-
(2004)
Surf. Sci
, vol.566-568
, pp. 343
-
-
Kuramochi, H.1
Ando, K.2
Tokizaki, T.3
Yasutake, M.4
Perez-Murano, F.5
Dagata, J.A.6
Yokoyama, H.7
-
38
-
-
0001472645
-
-
Inoue, A.; Ishida, T.; Choi, N.; Mizutani, W.; Tokumoto, H. Appl. Phys. Lett. 1998, 73, 1976.
-
(1998)
Appl. Phys. Lett
, vol.73
, pp. 1976
-
-
Inoue, A.1
Ishida, T.2
Choi, N.3
Mizutani, W.4
Tokumoto, H.5
|