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Volumn , Issue , 2006, Pages

Raman gain in helium ion implanted silicon waveguides

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON OPTICS; HELIUM; INERT GASES; ION BOMBARDMENT; ION IMPLANTATION; IONS; LASERS; QUANTUM ELECTRONICS; RADIOACTIVITY; SILICON; WAVEGUIDES;

EID: 55649114005     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CLEO.2006.4628295     Document Type: Conference Paper
Times cited : (5)

References (6)
  • 1
    • 0037168147 scopus 로고    scopus 로고
    • Stimulated Raman scattering in silicon waveguides
    • R.Claps, et al., "Stimulated Raman scattering in silicon waveguides," Elect. Lett. 38, 1352-1354, (2002).
    • (2002) Elect. Lett , vol.38 , pp. 1352-1354
    • Claps, R.1
  • 2
    • 10944223537 scopus 로고    scopus 로고
    • Nonlinear absorption and Raman scattering in silicon-on-insulator optical waveguides
    • T.K. Liang, et al., "Nonlinear absorption and Raman scattering in silicon-on-insulator optical waveguides," IEEE J.of Sel.Top. in Quant.Elect 10, 1149-1153 (2004).
    • (2004) IEEE J.of Sel.Top. in Quant.Elect , vol.10 , pp. 1149-1153
    • Liang, T.K.1
  • 3
    • 13544270152 scopus 로고    scopus 로고
    • Net continuous wave optical gain in a low loss silicon-on-insulator waveguide by stimulated Raman scattering
    • R. Jones, et al., "Net continuous wave optical gain in a low loss silicon-on-insulator waveguide by stimulated Raman scattering," Optics Express 13, 519-525 (2005).
    • (2005) Optics Express , vol.13 , pp. 519-525
    • Jones, R.1
  • 4
    • 14344257465 scopus 로고    scopus 로고
    • A continuous-wave Raman Silicon Laser
    • H.S.Rong, et al., "A continuous-wave Raman Silicon Laser," Nature 433 725-728 (2005).
    • (2005) Nature , vol.433 , pp. 725-728
    • Rong, H.S.1
  • 5
    • 4444288551 scopus 로고    scopus 로고
    • Characterization of recombination centers in Si epilayers after He implantation by direct measurement of local lifetime distribution with the AC lifetime profiling technique
    • P. Spirito, et al., "Characterization of recombination centers in Si epilayers after He implantation by direct measurement of local lifetime distribution with the AC lifetime profiling technique," IEEE Electron Device Lett. 25, 602-604 (2004).
    • (2004) IEEE Electron Device Lett , vol.25 , pp. 602-604
    • Spirito, P.1
  • 6
    • 55649103070 scopus 로고    scopus 로고
    • Helium implanted silicon waveguide photodetectors for optical power monitors
    • Anaheim, CA Paper OWI78
    • Y.Liu, et al., "Helium implanted silicon waveguide photodetectors for optical power monitors" In Proc. OFC2006, Anaheim, CA Paper OWI78, (2006).
    • (2006) Proc. OFC2006
    • Liu, Y.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.