Two-dimensional spectral shearing interferometry (2DSI) for ultrashort pulse characterization

Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference, CLEO/QELS 2006

Volumn , Issue , 2006, Pages

  Birge, Jonathan R ^a   Ell, Richard ^a,b   Kärtner, Franz X ^a  

^a Massachusetts Institute of Technology Cambridge   (United States)

^b Optical Coatings GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

PULSE CHARACTERIZATIONS; SPECTRAL SHEARING INTERFEROMETRIES; SPECTROMETER RESOLUTIONS; ULTRASHORT PULSE CHARACTERIZATIONS; ZERO DELAYS;

ELECTRON OPTICS; INTERFEROMETERS; INTERFEROMETRY; LASERS; QUANTUM ELECTRONICS; SHEARING; TWO DIMENSIONAL;

PULSED LASER APPLICATIONS;

EID: 55649103511     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CLEO.2006.4628389     Document Type: Conference Paper

References (4)

1. C. Iaconis and I. Walmsley, "Self-referencing spectral interferometry for measuring ultrashort pulses," IEEE JQE 35, 501-509 (1999).
2. L. Gallmann, D. Sutter, N. Matuschek, G. Steinmeyer, and U. Keller, "Techniques for the characterization of sub-10-fs optical pulses: a comparison," Appl. Phys. B 70, S67-S75 (2000).
3. K. Yamane, Z. Zhang, K. Oka, R. Morita and M. Yamashita, "Optical pulse compression to 3.4 fs in the monocycle region by feedback phase compensation," Optics Letters 28, 2258-2260 (2003).
4. Venteon UltraBroad, NanoLayers GmbH, www.nanolayers.de.