Raman scattering and X-ray diffraction on YBiTi2O7 prepared at low temperature

Journal of Raman Spectroscopy

Volumn 39, Issue 10, 2008, Pages 1469-1474

  Garbout, A ^a   Rubbens, A ^b   Vannier, R N ^b   Bouattour, S ^a   Kolsi, A W ^a  

^a University of Sfax   (Tunisia)

^b UNITÉ DE CATALYSE ET DE CHIMIE DU SOLIDE   (France)

Author keywords

Bismuth oxide; Pyrochlore; Raman scattering; Titanium oxide; XRD

Indexed keywords

BISMUTH COMPOUNDS; ENERGY DISPERSIVE SPECTROSCOPY; PARTICLE SIZE; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SOL-GELS; TEMPERATURE; TITANIUM OXIDES; TOXIC MATERIALS; YTTERBIUM COMPOUNDS;

CONDITION; DIETHANOLAMINE; LOWS-TEMPERATURES; PYROCHLORE STRUCTURES; PYROCHLORES; SINGLE PHASIS; SOL'GEL; TRIETHANOLAMINES; UNIT CELL PARAMETERS; X- RAY DIFFRACTIONS;

X RAY DIFFRACTION;

EID: 55449126010     PISSN: 03770486     EISSN: 10974555     Source Type: Journal    
DOI: 10.1002/jrs.2024     Document Type: Article

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