Multiple photoionization following 3d5/2-shell threshold ionization of Xe

Journal of Physics B: Atomic, Molecular and Optical Physics

Volumn 37, Issue 18, 2004, Pages 3745-3752

  Matsui, T ^a   Yoshii, H ^b   Tsukamoto, K ^b   Kawakita, S ^b   Murakami, E ^c   Adachi, J ^d   Yagishita, A ^d   Morioka, Y ^b   Hayaishi, T ^b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b UNIVERSITY OF TSUKUBA   (Japan)

^c CHIBA INSTITUTE OF TECHNOLOGY   (Japan)

^d INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; ELECTRON SPECTROSCOPY; ELECTRON TRANSITIONS; IONS; PHOTOIONIZATION; XENON;

AUGER DECAYS; BRANCHING RATIOS; CASCADE DECAYS; ELECTRON ION COINCIDENCE SPECTROSCOPY;

PARTICLE OPTICS;

EID: 5544325369     PISSN: 09534075     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-4075/37/18/014     Document Type: Article

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