Scanning transmission ion microscopy mass measurements for quantitative trace element analysis within biological samples and validation using atomic force microscopy thickness measurements

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 59, Issue 10-11, 2004, Pages 1733-1738

  Devès, Guillaume ^a   Cohen Bouhacina, Touria ^a   Ortega, Richard ^a  

^a UNIVERSITÉ DE BORDEAUX   (France)

Author keywords

AFM; PIXE; Quantitative analysis; Specific gravity; STIM

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL ANALYSIS; DENSITY (SPECIFIC GRAVITY); MASS SPECTROMETRY; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; TRACE ELEMENTS; TRANSMISSION ELECTRON MICROSCOPY;

CYTOPLASM; DRY MASS; NORMALIZATION; NUCLEAR MICROPROBE TECHNIQUES;

ION MICROSCOPES;

EID: 5544281755     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2004.04.015     Document Type: Conference Paper

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