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Volumn 8, Issue 8, 1997, Pages
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Measurements of the thickness uniformity of a liquid crystal layer
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 5544242267
PISSN: 10476938
EISSN: None
Source Type: Trade Journal
DOI: None Document Type: Article |
Times cited : (1)
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References (6)
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