Structures of Al/Si(100) surfaces as determined by scanning tunneling microscopy

Journal of Applied Physics

Volumn 80, Issue 7, 1996, Pages 4205-4207

  Zhu, Changxin ^a   Misawa, Shunji ^a   Tsukahara, Sonoko ^a  

^a ULVAC INC   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 5544231280     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363296     Document Type: Article

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