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Volumn 209, Issue 13, 2008, Pages 1367-1373

Ultra-small-angle X-ray scattering study of PET/PC nanolayers and comparison to AFM results

d DESY (Germany)

Author keywords

Atomic force microscopy (AFM); Co extrusion; Nanolayers; Structure; Ultra small angle X ray scattering (USAXS)

Indexed keywords

ABS RESINS; ATOMIC FORCE MICROSCOPY; COBALT; COBALT COMPOUNDS; CONCENTRATION (PROCESS); EXTRUSION; FORMING; MICROSCOPIC EXAMINATION; SCATTERING;

ATOMIC FORCE MICROSCOPY (AFM); CO-EXTRUSION; NANOLAYERS; STRUCTURE; ULTRA-SMALL-ANGLE X-RAY SCATTERING (USAXS);

X RAY SCATTERING;

EID: 55349149398 PISSN: 10221352 EISSN: 15213935 Source Type: Journal
DOI: 10.1002/macp.200700639 Document Type: Article

Times cited : (10)

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