In situ mechanical characterization of one dimensional nanoscale building blocks using novel microfabricated devices

2008 8th IEEE Conference on Nanotechnology, IEEE-NANO

Volumn , Issue , 2008, Pages 783-786

  Ganesan, Yogeeswaran ^a   Lu, Yang ^a   Lou, Jun ^a   Lu, Hao ^b  

^a Rice University   (United States)

^b RICE UNIVERSITY   (United States)

Author keywords

In situ; Microdevices; Nanoindenter; Nanomechanics

Indexed keywords

APPLIED FORCES; AXIAL TENSIONS; DISPLACEMENT CURVES; FABRICATION PROCESSES; FINITE ELEMENT ANALYSIS; IN SITU; LOADING PARAMETERS; MECHANICAL CHARACTERIZATIONS; MECHANICAL LOADINGS; METALLIC NANOWIRES; MICRODEVICES; MICROFABRICATED DEVICES; NANO SCRATCHES; NANOINDENTATION EXPERIMENTS; NANOINDENTER; NANOMECHANICAL CHARACTERIZATIONS; NANOSCALE BUILDING BLOCKS; NI NANOWIRES; SCANNING ELECTRON MICROSCOPES; SILICON ON INSULATORS; TENSILE SPECIMENS; TRANSMISSION ELECTRON MICROSCOPES;

CARBON NANOTUBES; ELECTRIC WIRE; FINITE ELEMENT METHOD; MICROSCOPES; NANOMECHANICS; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOTECHNOLOGY; NANOWIRES; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SILICON; SILICON WAFERS; TRANSMISSION ELECTRON MICROSCOPY;

NANOINDENTATION;

EID: 55349146940     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NANO.2008.234     Document Type: Conference Paper

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