Scanning impedance probe microscopy

2008 8th IEEE Conference on Nanotechnology, IEEE-NANO

Volumn , Issue , 2008, Pages 218-219

  Tanbakuchi, Hassan ^a   Han, Wenhai ^a   Richter, Matt ^a  

^a AGILENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CAPACITANCE; CAPACITANCE MEASUREMENT; ELECTRIC NETWORK ANALYSIS; MICROSCOPIC EXAMINATION; MULTIPLEXING EQUIPMENT; NANOTECHNOLOGY; RESONATORS; SCANNING;

CHARACTERISTIC IMPEDANCES; CONDUCTIVE ATOMIC FORCE MICROSCOPES; DEVICE UNDER TESTS; DIPLEXER; HIGH IMPEDANCES; IMPEDANCE PROBES; MEASURING IMPEDANCES; STIMULUS FREQUENCIES; VECTOR NETWORK ANALYZERS; VNA MEASUREMENTS; WAVELENGTH RESONATORS;

ELECTRIC NETWORK ANALYZERS;

EID: 55349134893     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NANO.2008.71     Document Type: Conference Paper

References (0)