Angular dependence of microwave absorption in multilayer films

Journal of Non-Crystalline Solids

Volumn 354, Issue 47-51, 2008, Pages 5195-5197

  Alvarez, G ^a   Montiel, H ^a   Cos, D de ^b   Garcia Arribas A ^b   Zamorano, R ^c   Barandiaran J M ^b   Valenzuela, R ^a  

^a UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

^b UNIVERSITY OF THE BASQUE COUNTRY UPV EHU   (Spain)

^c INSTITUTO POLITÉCNICO NACIONAL   (Mexico)

Author keywords

Alloys; Electron spin resonance; Microwave

Indexed keywords

ABSORPTION; ANISOTROPY; ELECTRON SPIN RESONANCE SPECTROSCOPY; FERROMAGNETIC RESONANCE; MAGNETIC FIELDS; MAGNETIC MATERIALS; MAGNETIC RESONANCE; METALLIC COMPOUNDS; MICROWAVES; MULTILAYERS; PROBABILITY DENSITY FUNCTION; RESONANCE; SPIN DYNAMICS;

AC FIELDS; ANGULAR DEPENDENCES; DC FIELDS; DC MAGNETIC FIELDS; DOUBLE PEAKS; ELECTRON SPIN RESONANCE; FIELD MICROWAVE ABSORPTIONS; FILM PLANES; FMR MEASUREMENTS; LONGITUDINAL ORIENTATIONS; MAGNETIC PHASES; MICROWAVE ABSORPTIONS; RESONANCE FIELDS; SHAPE ANISOTROPIES; TRANSVERSE ANISOTROPIES; TRANSVERSE ORIENTATIONS; ZERO FIELDS;

MULTILAYER FILMS;

EID: 55349120464     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2008.08.017     Document Type: Article

References (8)

1. Alvarez G., Montiel H., de Cos D., Zamorano R., García-Arribas A., Barandiarán J.M., and Valenzuela R. J. Non-Cryst. Solids 353 (2007) 902
2. Montiel H., Alvarez G., Gutiérrez M.P., Zamorano R., and Valenzuela R. Sensor Lett. 5 (2007) 58
3. de Cos D., Alvarez G., García-Arribas A., Montiel H., Barandiaran J.M., Zamorano R., and Valenzuela R. Sens. Actuat. A 142 (2008) 485
4. Montiel H., Alvarez G., Zamorano R., and Valenzuela R. J. Non-Cryst. Solids 353 (2007) 908
5. Montiel H., Alvarez G., Betancourt I., Zamorano R., and Valenzuela R. Phys. B 384 (2006) 297
6. H. Montiel, G. Alvarez, R. Zamorano, R. Valenzuela, unpublished results.
7. Montiel H., Alvarez G., Gutiérrez M.P., Zamorano R., and Valenzuela R. J. Alloys Compd. 369 (2004) 141
8. Montiel H., Alvarez G., Betancourt I., Zamorano R., and Valenzuela R. Appl. Phys. Lett. 86 (2005) 072503