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Volumn 33, Issue 19, 2008, Pages 2275-2277

Materials with on-demand refractive indices in the terahertz range

Author keywords

[No Author keywords available]

Indexed keywords

BIREFRINGENCE; PLASMA ETCHING; REFRACTIVE INDEX; SILICON WAFERS;

BUILDING BLOCKES; DEFECT MODE; DIELECTRIC SUBSTRATES; FILLING FACTOR; INDUCTIVE PLASMA; ON DEMANDS; TERAHERTZ RANGE; THICK LAYERS;

DIELECTRIC MATERIALS;

EID: 55349112161 PISSN: 01469592 EISSN: None Source Type: Journal
DOI: 10.1364/OL.33.002275 Document Type: Article

Times cited : (26)

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