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Volumn 104, Issue 8, 2008, Pages

Direct imaging of current paths in multiwalled carbon nanofiber polymer nanocomposites using conducting-tip atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ABS RESINS; ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; CARBON; CARBON NANOFIBERS; CONDUCTING POLYMERS; ELECTRIC CURRENTS; ELECTRIC PROPERTIES; ETCHING; MICROSCOPIC EXAMINATION; NANOCOMPOSITES; NANOFIBERS; OXYGEN; PERCOLATION (FLUIDS); PLASMA ETCHING; POLYMER MATRIX COMPOSITES; POLYMERS; SCANNING PROBE MICROSCOPY; SIZE DISTRIBUTION; SKIN;

EID: 55249125715     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3000458     Document Type: Article
Times cited : (39)

References (21)
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  • 19
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    • Applied Sciences, Inc., Cedarville, Ohio.
    • Applied Sciences, Inc., Cedarville, Ohio http://www.apsci.com.
  • 21
    • 34547590039 scopus 로고    scopus 로고
    • 0009-2614 10.1016/j.cplett.2007.06.112.
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    • Gurevitch, I.1    Srebnik, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.