Reduction of chlorinated methanes with nano-scale Fe particles: Effects of amphiphiles on the dechlorination reaction and two-parameter regression for kinetic prediction

Chemosphere

Volumn 73, Issue 11, 2008, Pages 1817-1823

  Feng, Jing ^a   Zhu, Bao wei ^a   Lim, Teik Thye ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

Carbon tetrachloride; Chloroform; Humic acid; Nano scale Fe particle; Surfactant

Indexed keywords

ACIDS; AMPHIPHILES; ANESTHETICS; ANIONIC SURFACTANTS; ATMOSPHERIC CORROSION; BIOLOGICAL MATERIALS; CARBON TETRACHLORIDE; CHEMISORPTION; CONCENTRATION (PROCESS); CORROSION; CORROSION RATE; DECHLORINATION; DIFFUSERS (OPTICAL); DYES; ELECTROCHEMICAL CORROSION; HYDROXYLATION; METHANE; MOLECULAR ORBITALS; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; ORGANIC ACIDS; PHASE INTERFACES; RATE CONSTANTS; REACTION RATES; REGRESSION ANALYSIS; SODIUM; SODIUM SULFATE; SOLUTIONS; SURFACE ACTIVE AGENTS; SURFACE CHEMISTRY; SURFACE TENSION; TEMPERATURE CONTROL;

AMPHIPHILE SOLUTIONS; CHLORINATED METHANES; CHLOROFORM; DECHLORINATION RATES; DECHLORINATION REACTIONS; DESCRIPTORS; ELECTRON TRANSFER MEDIATORS; FIRST ORDER KINETIC; HUMIC ACID; HUMIC ACIDS; HYDROPHILIC HEADS; LIQUID INTERFACES; LOWEST UNOCCUPIED MOLECULAR ORBITALS; MATRIX SOLUTIONS; NANO-SCALE FE PARTICLE; PARENT COMPOUNDS; REDUCTION RATES; SODIUM DODECYL SULFATE SOLUTIONS; SURFACTANT; ULTRAPURE WATERS;

ANALYSIS OF VARIANCE (ANOVA);

AMPHOPHILE; CARBON TETRACHLORIDE; CHLOROFORM; DODECYL SULFATE SODIUM; HUMIC ACID; IRON; METHANE;

CHLORINATION; CONCENTRATION (COMPOSITION); CORROSION; DECHLORINATION; HUMIC ACID; IRON; KINETICS; METHANE; REDUCTION; REGRESSION ANALYSIS; SURFACTANT;

ARTICLE; CHEMICAL INTERACTION; CHEMICAL REACTION; CORROSION; DECHLORINATION; ELECTRON TRANSPORT; OUTCOME ASSESSMENT; REDUCTION KINETICS; SURFACE TENSION;

ADSORPTION; HALOGENATION; HUMIC SUBSTANCES; HYDROCARBONS, CHLORINATED; IRON; KINETICS; METAL NANOPARTICLES; METHANE; OXIDATION-REDUCTION; REGRESSION ANALYSIS; SPECTROSCOPY, FOURIER TRANSFORM INFRARED; SURFACE-ACTIVE AGENTS;

EID: 55249118805     PISSN: 00456535     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.chemosphere.2008.08.014     Document Type: Article

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