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Journal of Applied Physics

Volumn 104, Issue 8, 2008, Pages

Structure and surface morphology of vapor deposited polycarbonate thin films

(2) Vree, C a Mayr, S G a

a UNIVERSITY OF GÖTTINGEN (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; CHROMATOGRAPHIC ANALYSIS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; FOURIER TRANSFORMS; GALLIUM ALLOYS; HIGH PERFORMANCE LIQUID CHROMATOGRAPHY; INFRARED SPECTROSCOPY; MASS SPECTROMETRY; MICROSCOPIC EXAMINATION; PHENOLS; PLASTIC PRODUCTS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SILICON; SIZE EXCLUSION CHROMATOGRAPHY; SPECTROSCOPIC ANALYSIS; SPECTRUM ANALYSIS; SUBSTRATES; SURFACE MORPHOLOGY; SURFACE STRUCTURE; THICK FILMS; THIN FILMS; VAPORS;

DEWETTING; DISCONTINUOUS SURFACES; EXCLUSION CHROMATOGRAPHIES; FILM INTERFACES; FOURIER TRANSFORM INFRARED; HOMOGENEOUS SURFACES; POLY(BISPHENOL A CARBONATE); POLYCARBONATE SUBSTRATES; SCANNING FORCE MICROSCOPIES; SMOOTH SURFACES; SPIN CASTS;

AMORPHOUS FILMS;

EID: 55249117967 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3000659 Document Type: Article

Times cited : (9)

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