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Volumn 98, Issue , 2008, Pages 416-417

High dose of helium implanted in nano-cavity tungsten to evaluate threshold of surface blistering due to he bubble formation, invited

Author keywords

[No Author keywords available]

Indexed keywords


EID: 55249096915     PISSN: 0003018X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (1)

References (9)
  • 3
    • 55249121261 scopus 로고    scopus 로고
    • http://aries.ucsd.edu/ARIES/
  • 8
    • 55249124858 scopus 로고    scopus 로고
    • private correspondence with Scott O'Dell of Plasma Processes, Inc.
    • private correspondence with Scott O'Dell of Plasma Processes, Inc.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.