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Volumn 2, Issue 11, 2008, Pages 661-663
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Scanning interferometry: Measuring microscale devices
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Author keywords
[No Author keywords available]
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Indexed keywords
MICROSCALE DEVICES;
PHOTONICS;
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EID: 55249096469
PISSN: 17494885
EISSN: 17494893
Source Type: Journal
DOI: 10.1038/nphoton.2008.216 Document Type: Short Survey |
Times cited : (15)
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References (0)
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