Dependence of thermally stimulated current in PZT film capacitors on PZT-electrode interface

Ferroelectrics

Volumn 357, Issue 1 PART 3, 2007, Pages 243-247

  Nishida, Takashi ^a   Takeda, Takashi ^a   Uchiyama, Kiyoshi ^a   Shiosaki, Tadashi ^a  

^a NARA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

Author keywords

Interface and crystalline defects; PZT film; Thermally stimulated current

Indexed keywords

BOTTOM ELECTRODES; CRYSTALLINE DEFECTS; ELECTRODE INTERFACE; FILM DEVICES; HIGH DENSITY; LEAD CONTENT; MEASUREMENT METHODS; ORGANIC MATERIALS; PB(ZR ,TI)O; PZT; PZT DEPOSITION; PZT FILM; THERMALLY STIMULATED CURRENT;

CRYSTALLINE MATERIALS; DEFECTS; ELECTROLYTIC CAPACITORS; FERROELECTRIC FILMS; FERROELECTRICITY; LEAD; PIEZOELECTRIC MATERIALS; SEMICONDUCTING LEAD COMPOUNDS; THERMOLUMINESCENCE; ZIRCONIUM;

PIEZOELECTRIC ACTUATORS;

EID: 55149122490     PISSN: 00150193     EISSN: 15635112     Source Type: Journal    
DOI: 10.1080/00150190701545342     Document Type: Conference Paper

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