Study of the L2,3 edges of 3d transition metals by X-ray absorption spectroscopy

Thin Solid Films

Volumn 517, Issue 2, 2008, Pages 1000-1004

  Akgul G ^a   Aksoy, F ^a,b   Bozduman, A ^a   Ozkendir, O M ^a   Ufuktepe, Y ^a   Luning J ^c  

^a CUKUROVA UNIVERSITY   (Turkey)

^b NIGDE UNIVERSITY   (Turkey)

^c SORBONNE UNIVERSITÉ   (France)

Author keywords

3d transition metals; Absorption length; Cobalt; Copper; Electron emission; Escape depth; Iron; Metals; NEXAFS; Thin film; X ray photoelectron spectroscopy

Indexed keywords

ABSORPTION; ATOMS; COBALT; COPPER; ELECTROMAGNETIC WAVE ABSORPTION; ELECTRONS; EMISSION SPECTROSCOPY; ENERGY ABSORPTION; METALS; MULTIPHOTON PROCESSES; PHOTOELECTRON SPECTROSCOPY; PHOTONS; THICK FILMS; TRANSITION METALS; X RAY ABSORPTION; X RAY PHOTOELECTRON SPECTROSCOPY; X RAY SPECTROSCOPY;

3D TRANSITION METALS; ABSORPTION FINE STRUCTURES; ABSORPTION LENGTH; CORE HOLES; EMITTED ELECTRONS; ENERGY REGIONS; ESCAPE DEPTH; FLUORESCENCE PHOTONS; NEXAFS; SECONDARY PARTICLES; SYSTEMATIC INVESTIGATIONS;

ABSORPTION SPECTROSCOPY;

EID: 55049141108     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2008.08.173     Document Type: Article

References (31)

1. Leapman R.D., Grunes L.A., and Fejes P.L. Phys. Rev. B 26 (1982) 614
2. Stöhr J. NEXAFS Spectroscopy. Vol. 25 of Springer Series in Surface Sciences (1992), Springer, Heidelberg
3. Bianconi A. In: Prins R., and Konningsberger D.C. (Eds). X-Ray Absorption: Principles, Applications and Techniques of EXAFS, SEXAFS and XANES (1988), Wiley, New York
4. Lee P.A., Citrin P.H., Eisenberg P., and Kincaid B.M. Rev. Mod. Phys. 53 (1981) 769
5. Leapman R.D., Grunes L.A., and Fejesi P.L. Phys. Rev. B 26 (1982) 614
6. Pearson D.H., Fultz B., and Ahn C.C. Appl. Phys. Lett. 53 (1988) 1405
7. Thole B.T., Cowan R.D., Sawatzky G.A., Fink J., and Fuggle J.C. Phys. Rev. B 31 (1985) 6856
8. Fink J., Muller T.H., Scheerer B., Speier W., Hillebrecht F.U., Fuggle J.C., Zaanen J., and Sawatzky G.A. Phys. Rev. B 32 (1985) 4899
9. Chakarian V., Idzerda Y.U., and Chen C.T. Phys. Rev. B 57 (1998) 5312
10. Grioni M., Goedkoop J.B., Schoorl R., de Groot F.M.F., Fuggle J.C., Schafers F., Koch E.E., Rossi G., Esteva J.M., and Kartanak R.C. Phys. Rev. B 39 (1989) 1541
11. Regan T.J., Ohldag H., Stamn C., Nolting F., Luning J., Stohr J., and White R.L. Phys. Rev. B 64 (2001) 214422
12. Fauth K. Appl. Phys. Lett. 85 (2004) 3271
13. Waddington W.G., Rez P., Grant I.P., and Humphreys C.J. Phys. Rev. B 34 (1986) 1467
14. Arp U., Iemura K., Kutluk G., Meyer M., Nagata T., Sacchi M., Sonntag B., Yag S., and Yagishita A. J. Phys. B: At. Mol. Opt. Phys. 27 (1994) 3389
15. Bzowski A., Sham T.K., and Yiu Y.M. Phys. Rev. B 49 (1994) 13776
16. Grioni M., Van Acker J.F., Czyzyk M.T., and Fuggle J.C. Phys. Rev. B 45 (1992) 3309
17. Ebert H., Stohr J., Parkin S.S.P., Samant M., and Nilsson A. Phys. Rev. B 53 (1996) 16067
18. Vogel J., and Sacchi M. Phys. Rev. B 49 (1994) 13401
19. Arp U., Federmann F., Kallne E., Sonntag B., and Sorensen S.L. J. Phys. B: At. Mol. Opt. Phys. 25 (1992) 3747
20. Van der Laan G., and Thole B.T. Phys. Rev. B 43 (1991) 13401
21. Van der Laan G., and Kirkman I.W. J. Phys. Condens. Matter 4 (1992) 4189
22. Gota S., Gautier-Soyer M., and Sacchi M. Phys. Rev. B, 62 (2000) 4187
23. Dunn J.H., Arvanitis D., Martensson N., Tischer M., May F., Russo M., and Barberschke K. J. Phys. Condens. Matter 7 (1995) 1111
24. Nakajima R., Stöhr J., and Idzerda Y.U. Phys. Rev. B 59 (1999) 6421
25. Rehr J.J., and Albers R.C. Phys. Rev. B 41 (1990) 8139
26. Mustre de Leon J., Rehr J.J., Zabinsky S.I., and Albers R.C. Phys. Rev. B 44 (1991) 4146
27. Thole B.T., van der Laan G., Fuggle J.C., Sarwatzky G.A., Karnatak R.C., and Esteva J.M. Phys. Rev. B 32 (1985) 5107
28. Henneken H., Scholze F., and Ulm G. J. Electron Spectrosc. Relat. Phenom. 101-103 (1999) 1019
29. Eisebitt S., Böske T., Rubensson J.-E., and Eberhardt W. Phys. Rev. B 47 (1993) 14103
30. Ufuktepe Y., Akgul G., and Luning J. J. Alloys Comp. 401 (2005) 193
31. Chen C.T., Idzerda Y.U., Lin H.-J., Smith N.V., Meigs G., Chaban E., Ho G.H., Pellegrin E., and Sette F. Phys. Rev. Lett. 75 (1995) 152