Automated diagnosis of product-line configuration errors in feature models

Proceedings - 12th International Software Product Line Conference, SPLC 2008

Volumn , Issue , 2008, Pages 225-234

  White, J ^a   Schmidt, D C ^a   Benavides, D ^b   Trinidad, P ^b   Ruiz Cortes A ^b  

^a VANDERBILT UNIVERSITY   (United States)

^b UNIVERSITY OF SEVILLE   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER OPERATING PROCEDURES; ERRORS; PROGRAM DIAGNOSTICS;

AUTOMATED DIAGNOSIS; AUTOMATED TECHNIQUES; CONSTRAINT SATISFACTION PROBLEMS; CONSTRAINT SOLVERS; FEATURE MODELS; FEATURE SELECTIONS; FEATURE SETS; LINE CONFIGURATIONS; MULTIPLE STAGES; NEW TECHNIQUES; SOFTWARE PRODUCTS;

COMPUTER SOFTWARE SELECTION AND EVALUATION;

EID: 55049102931     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SPLC.2008.16     Document Type: Conference Paper

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