Structural and dielectric properties of Ba3V2O8 ceramics

Current Applied Physics

Volumn 9, Issue 2, 2009, Pages 515-519

  Khatri, Praveen ^a   Behera, Banarji ^a   Srinivas, V ^a   Choudhary, R N P ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY   (India)

Author keywords

A. X ray diffraction; B. Dielectric; C. Electrical conductivity

Indexed keywords

ACTIVATION ENERGY; BARIUM; BUILDING MATERIALS; CERAMIC CAPACITORS; CRYSTAL STRUCTURE; DIELECTRIC PROPERTIES; DIFFRACTION; ELECTRIC CONDUCTIVITY; ELECTRIC PROPERTIES; SCANNING ELECTRON MICROSCOPY; X RAY ANALYSIS; X RAY DIFFRACTION;

A. X-RAY DIFFRACTION; AC CONDUCTIVITIES; B. DIELECTRIC; C. ELECTRICAL CONDUCTIVITY; DIELECTRIC DATUM; HEXAGONAL; HIGH-TEMPERATURE; HIGHER TEMPERATURES; MICROSTRUCTURAL ANALYSES; POLYCRYSTALLINE SAMPLES; ROOM TEMPERATURES; SCANNING ELECTRON MICROSCOPES; SOLID-STATE REACTIONS; TEMPERATURE DEPENDENCES; TEMPERATURE DEPENDENTS; WIDE FREQUENCY RANGES; X-RAY DIFFRACTIONS;

X RAY DIFFRACTION ANALYSIS;

EID: 55049102610     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2008.05.002     Document Type: Article

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