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Volumn 517, Issue 2, 2008, Pages 681-685

Influence of the annealing temperature on the properties of undoped indium oxide thin films obtained by the sol-gel method

(5) Flores Mendoza, M A a Castanedo Perez, R a Torres Delgado, G a Marquez Marin J a Zelaya Angel, O a

a DEPARTAMENTO DE FÍSICA (Mexico)

Author keywords

Electrical properties; In2O3 films; Indium oxide; Sol gel; Thin films; Transparent conductive oxides; X ray diffraction

Indexed keywords

COLLOIDS; CONDUCTIVE FILMS; CRYSTALLINE MATERIALS; DIFFRACTION; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; ELECTRIC PROPERTIES; GALVANOMAGNETIC EFFECTS; GELATION; GELS; HALL EFFECT; INDIUM; LIGHT; MAGNETIC FIELD EFFECTS; OXIDE FILMS; PHOTOCONDUCTIVITY; QUALITY CONTROL; SOL-GEL PROCESS; SOL-GELS; SOLS; SPACE PROBES; THICK FILMS; THIN FILMS; ULTRAVIOLET SPECTROSCOPY; X RAY ANALYSIS; X RAY DIFFRACTION;

ELECTRICAL PROPERTIES; IN2O3 FILMS; INDIUM OXIDE; SOL-GEL; TRANSPARENT CONDUCTIVE OXIDES;

ANNEALING;

EID: 55049095802 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2008.07.036 Document Type: Article

Times cited : (45)

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