Failure analysis of a phosphor-converted white light-emitting diode due to the CaS:Eu phosphor

Japanese Journal of Applied Physics

Volumn 47, Issue 5 PART 1, 2008, Pages 3524-3526

  Shin, Hyun Ho ^a   Kim, Jin Hyung ^a   Han, Bo Yong ^a   Yoo, Jae Soo ^a  

^a Chung Ang University   (South Korea)

Author keywords

CaS:Eu; Coating; Moisture resistance; Phosphor; White LED

Indexed keywords

COLLOIDS; CONCENTRATION (PROCESS); ELECTROMAGNETIC WAVES; EUROPIUM; FAILURE ANALYSIS; GELATION; LEAKAGE (FLUID); LIGHT EMISSION; LUMINESCENCE; MOISTURE; PHOSPHORS; QUALITY ASSURANCE; SAFETY FACTOR; SILICON COMPOUNDS; SILVER; SOL-GEL PROCESS; SUGAR (SUCROSE);

CAS:EU; COATING CHARACTERISTICS; GAS RELEASES; LED CHIPS; MOISTURE RESISTANCE; MOISTURE RESISTANCES; PH VALUES; PRECURSOR CONCENTRATIONS; PROCESSING VARIABLES; RED PHOSPHORS; SOL - GELS; WHITE LEAD; WHITE LED; WHITE LIGHT;

LIGHT EMITTING DIODES;

EID: 55049090047     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.47.3524     Document Type: Article

References (9)

1. S. Nakamura, T. Mukai, and M. Senoh: J. Appl. Phys. Lett. 64 (1994) 1687.
2. N. Narendran, Y. Gu, J. P. Freyssinier, H. Yu, and L. Deng: J. Cryst. Growth 268 (2004) 449.
3. J. S. Yoo, S. H. Kim, W. T. Yoo, G. Y. Hong, K. P. Kim, J. Rowland, and P. H. Holloway: J. Electrochem. Soc. 152 (2005) G382.
4. M. Pham-Thi: J. Alloys Compd. 225 (1995) 547.
5. C. Guo, B. Chu, M. Wu, and Q. Su: J. Lumin. 105 (2003) 121.
6. W. Park, K. Yasuda, B. K. Wagner, C. J. Summers, Y. R. Do, and H. G. Yang: Mater. Sci. Eng. B 76 (2000) 122.
7. Y. R. Do, D. H. Park, H. G. Yang, W. Park, B. K. Wagner, K. Yasuda, and C. J. Summers: J. Electrochem. Soc. 148 (2001) G54S.
8. Y. R. Do, D. H. Park, and Y. S. Kim: J. Electrochem. Soc. 151 (2004) H210.
9. T. Suzuki, H. Yamamoto, K. Megumi, O. Kanehusa, Y. Morita, N. Watanabe, and Y. Uehara: J. Electrochem. Soc. 134 (1987) 2620.