Direct measurement of total emissivities at cryogenic temperatures: Application to satellite coatings

Cryogenics

Volumn 48, Issue 11-12, 2008, Pages 463-468

  Herve, P ^a   Rambure, N ^a   Sadou, A ^a   Ramel, D ^a   Francou, L ^a   Delouard, P ^b   Gavila, E ^c  

^a UNIVERSITÉ PARIS OUEST NANTERRE LA DÉFENSE   (France)

^b Oerlikon Space AG   (Switzerland)

^c THALES ALENIA SPACE   (France)

Author keywords

C. Heat transfer; C. Radiant properties; D. Infrared detectors; F. Space cryogenics

Indexed keywords

COATINGS; COSMOLOGY; CRYOGENICS; DETECTORS; ELECTROMAGNETIC WAVE EMISSION; ELECTROMAGNETIC WAVES; FORCE MEASUREMENT; MATERIALS PROPERTIES; OPTICAL INSTRUMENTS; OPTICAL MATERIALS; OPTICAL PROPERTIES; OPTICAL TELESCOPES; PHOTOGRAPHY; SATELLITE OBSERVATORIES; SATELLITES; TELESCOPES;

C. HEAT TRANSFER; C. RADIANT PROPERTIES; COSMIC MICROWAVE BACKGROUNDS; CRYOGENIC TEMPERATURES; D. INFRARED DETECTORS; DEEP SPACES; DIRECT MEASUREMENTS; DIRECTIONAL EMISSIVITIES; EQUIVALENT TEMPERATURES; EUROPEAN SPACE AGENCIES; F. SPACE CRYOGENICS; LOW TEMPERATURES; MEASUREMENT APPARATUSES; PLANCK MISSIONS; PLANCK TELESCOPES; SATELLITES APPLICATIONS; SPECTRAL RANGES; TEMPERATURE ANISOTROPIES; THERMAL MODELLING; TOTAL EMISSIVITIES;

SPACECRAFT OBSERVATORIES;

EID: 54949158097     PISSN: 00112275     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cryogenics.2008.07.007     Document Type: Review

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