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Volumn 130, Issue 4, 2008, Pages 410-418

Corrections to air kerma and exposure measured with free air ionisation chambers for charge of photoelectrons, Compton electrons and auger electrons

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; NITROGEN; OXYGEN;

EID: 54949151458     PISSN: 01448420     EISSN: None     Source Type: Journal    
DOI: 10.1093/rpd/ncn093     Document Type: Article
Times cited : (7)

References (15)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.