Imaging method for acoustic impedance difference for puncture needle-type ultrasonography using a thin rod with focusing end face

Japanese Journal of Applied Physics

Volumn 47, Issue 5 PART 2, 2008, Pages 4176-4179

  Yoshizawa, Masasumi ^a   Irie, Takasuke ^b   Itoh, Kouichi ^c   Moriya, Tadashi ^d  

^a TOKYO METROPOLITAN COLLEGE OF INDUSTRIAL TECHNOLOGY   (Japan)

^b Microsonic Ltd   (Japan)

^c Hitachi Omiya Saiseikai Hospital   (Japan)

^d TOKYO METROPOLITAN UNIVERSITY   (Japan)

Author keywords

Fixed length transmission line; Transducer vibration method; Ultrasonic interference method; Ultrasonic microscope; Variable length transmission line

Indexed keywords

ACOUSTIC IMPEDANCE MEASUREMENT; ACOUSTICS; ELECTRIC LINES; NEEDLES; OXIDE MINERALS; POWER TRANSMISSION; QUARTZ; TRANSMISSION LINE THEORY; ULTRASONIC IMAGING; ULTRASONICS; ULTRASONOGRAPHY;

FIXED-LENGTH TRANSMISSION LINE; TRANSDUCER VIBRATION METHOD; ULTRASONIC INTERFERENCE METHOD; ULTRASONIC MICROSCOPE; VARIABLE-LENGTH TRANSMISSION LINE;

ACOUSTIC IMPEDANCE;

EID: 54949140796     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.47.4176     Document Type: Article

References (17)

1. R. C. Chivers: Ultrasound Mod. Biol. 7 (1981) 1.
2. M. Tanaka, H. Ohkawai, N. Cyubachi, J. Kushibiki, and T. Sannomiya: Proc. 4th Symp. Ultrasonic Electronics, Tokyo, 1983, Jpn. J. Appl. Phys. 23 (1984) Suppl. 23-1, p. 197.
3. H. Okawai, M. Tanaka, N. Cyubachi, and J. Kushibiki: Proc. 7th Symp. Ultrasonic Electronics, Kyoto, 1986, Jpn. J. Appl. Phys. 26 (1987) Suppl. 26-1, p. 52.
4. H. Hachiya and S. Ohtsuki: J. Acoust. Soc. Am. 92 ( 1992) 1564.
5. H. Hachiya, S. Ohtsuki, and M. Tanaka: Jpn. J. Appl. Phys. 33 ( 1994) 3130.
6. Y. Saijo, N. Hozumi, K. Kobayashi, N. Okada, T. Ishiguro, Y. Hagiwara, E. D. S. Fillio, and T. Yambe: Proc. IEEE Engineering in Medical and Biology Soc, 2007, Vol. 1, p. 1350.
7. Y. Saijo, E. S. Filho, H. Sasaki, T. Yarabe, M. Tanaka, N. Hozumi, K. Kobayashi, and N. Okada: IEEE Trans. Ultrason. Ferroelectr. Freq. Control 54 (2007) 1571.
8. Japan Unexamined Patent Application No. H02-107238 (ALL).
9. Japan Unexamined Patent Application No. H02-107239 (ALL).
10. Japan Unexamined Patent Application No. H11 -206759 (ALL).
11. H. Yamaguchi, M. Yoshizawa, N. Tagawa, T. Moriya, and S. Yagi: Jpn. J. Appl. Phys. 36 (1997) 3287.
12. T. Moriya, Y. Furumoto, and N. Tagawa: Proc. IEEE Ultrasonics Symp., 1998, p. 1389.
13. R. Hatakeyama, M. Yoshizawa, and T. Moriya: Jpn. J. Appl. Phys. 39 (2000) 6449.
14. M. Yoshizawa, Y. Komiya, and T. Moriya: Jpn. J. Appl. Phys. 45 (2006) 4703.
15. M. Yoshizawa, Y. Nakamura, M. Ishiguro, and T. Moriya: Jpn. J. Appl, Phys, 46 (2007) 4868.
16. M. Yoshizawa, S. Kiryu, T. Moriya, and T. Fuse: Proc. 8th Symp. Ultrasonic Electronics, Tokyo, 1987, Jpn. J. Appl. Phys. 27 (1988) Suppl. 27-1, p. 117.
17. M. Yoshizawa, N. Tagawa. E. Watanabe, T. Moriya, and S. Yagi: Jpn. J. Appl. Phys. 36 (1997) 3157.