The performance evaluation of IEC flicker meters in realistic conditions

IEEE Transactions on Instrumentation and Measurement

Volumn 57, Issue 11, 2008, Pages 2443-2449

  Bucci, Giovanni ^a   Fiorucci, Edoardo ^a   Ciancetta, Fabrizio ^a  

^a UNIVERSITY OF L'AQUILA   (Italy)

Author keywords

Automatic test system; Light flicker; Voltage measurement

Indexed keywords

AUTOMATIC TESTING; BRAIN; ELECTRIC MEASURING INSTRUMENTS; ELECTROMAGNETIC WAVES; ELECTRONIC EQUIPMENT TESTING; INTERNATIONAL COOPERATION; METRIC SYSTEM; MODULATION; POWER QUALITY;

AUTOMATIC TEST SYSTEM; AUTOMATIC TEST SYSTEMS; BRAIN ACTIVITIES; COMPLEX SHAPES; IEC FLICKER METERS; INTERNATIONAL ELECTROTECHNICAL COMMISSIONS; INTERNATIONAL ORGANIZATIONS; LIGHT FLICKER; LIGHT FLICKERS; MEASUREMENT RESULTS; PERFORMANCE EVALUATIONS; REALISTIC CONDITIONS; SEVERITY INDICES; SYNTHESIS OF; VOLTAGE FLUCTUATIONS; VOLTAGE INPUTS; VOLTAGE WAVEFORMS;

FLICKERING;

EID: 54949138764     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2008.925012     Document Type: Article

References (6)

1. EN 61000-4-15, Flicker Meter - Functional and Design Specifications 2003-01.
2. E. Fiorucci, D. Gallo, C. Landi, and R. Langella, "Light flicker: Theoretical and metrological aspects," Trans. Syst., Signals Devices vol. 1, no. 4, 2006.
3. T. Key, D. Nastasi, H. Sakulin, J. Harding, and T. Cooke, System Compatibility Research Project Final Report, Task 21: Power Line Monitors, Part II: Flicker Meters. Knoxville, TN: EPRI PEAC Corp., 1999.
4. M. Piekarz, M. Szlosek, Z. Hanzelka, A. Bien, A. Stankiewicz, and M. Hartman, "Comparative tests of flickermeters," in Proc. 10th Int. Conf. Harmonics Quality Power, Oct. 6-9, 2002, vol. 1, pp. 220-227.
5. CIGRE 36.05/CIRED WG 2/UIEPQ Joint Working Group CCU2 on Voltage Quality, Test Protocol of IEC Flicker Meter Used in Power System Voltage Monitoring, Jul. 2004. Draft 11.
6. G. Bucci, F. Di Nicola, F. Ciancetta, and E. Fiorucci, "The performance evaluation of IEC flicker meters in realistic conditions," in Proc. IEEE Instrum. Meas. Technol. Conf., Sorrento, Italy, Apr. 24-27, 2006, pp. 1592-1596.