Thermal aging micro-scale analysis of power transformer pressboard

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 15, Issue 5, 2008, Pages 1281-1287

  Liao, Rui Jin ^a   Tang, Chao ^a   Yang, Li Jun ^a   Grzybowski, Stanislaw ^b  

^a CHONGQING UNIVERSITY   (China)

^b MISSISSIPPI STATE UNIVERSITY   (United States)

Author keywords

Atomic force microscope (AFM); Insulation; Power transformer; Pressboard; Scanning electron microscope (SEM); Thermal aging; X ray diffraction (X RD)

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; CELLULOSE; CELLULOSE DERIVATIVES; CRYSTALLITE SIZE; DIFFRACTION; ELECTRIC INSTRUMENT TRANSFORMERS; ELECTRIC TRANSFORMER INSULATION; ELECTRIC TRANSFORMER TESTING; MICROSCOPES; MICROSCOPIC EXAMINATION; PAPER; POWER TRANSFORMERS; SCANNING; SCANNING ELECTRON MICROSCOPY; SECONDARY EMISSION; STRENGTH OF MATERIALS; TESTING; THERMAL AGING; THERMAL STRESS; THERMOELASTICITY; TRANSFORMER SUBSTATIONS; X RAY ANALYSIS; X RAY DIFFRACTION;

ACCELERATED THERMAL AGING; AGING MECHANISMS; ATOMIC FORCE MICROSCOPE (AFM); ATOMIC FORCE MICROSCOPES; AVERAGE WIDTHS; CELLULOSE FIBERS; GLUCOPYRANOSE; HEXAGONAL MESHES; INSULATION PAPERS; MICRO SURFACES; PRESSBOARD; RELATIVE CRYSTALLINITY; SCALE ANALYSIS; SCANNING ELECTRON MICROSCOPE (SEM); SCANNING ELECTRON MICROSCOPES; TRANSFORMER PRESSBOARDS; X-RAY DIFFRACTION (X-RD); X-RAY DIFFRACTIONS;

THERMAL INSULATION;

AGING; CELLULOSE DERIVATIVES; CRYSTALLITES; DIFFRACTION; ELASTICITY; INSULATION; TRANSFORMERS;

EID: 54949132887     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2008.4656235     Document Type: Article

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