Flow lines with regular service times: Evolution of delay, state dependent failures and semiconductor wafer fabrication

4th IEEE Conference on Automation Science and Engineering, CASE 2008

Volumn , Issue , 2008, Pages 247-252

  Morrison, James R ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; SALES; SEMICONDUCTOR MATERIALS; SERVERS;

ASSEMBLY LINES; FLOW LINES; NATURAL DECOMPOSITIONS; SEMICONDUCTOR WAFER FABRICATIONS; SEMICONDUCTOR WAFERS; SERIAL PROCESSING; SERVICE TIMES; STATE DEPENDENTS; TANDEM QUEUES;

CUSTOMER SATISFACTION;

EID: 54949100446     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/COASE.2008.4626466     Document Type: Conference Paper

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