-
1
-
-
0015726255
-
Characterization of nonlinearities in microwave devices and systems
-
Dec
-
G. Heiter, "Characterization of nonlinearities in microwave devices and systems," IEEE Trans. Microw. Theory Tech., vol. MTT-21, no. 12, pp. 797-805, Dec. 1973.
-
(1973)
IEEE Trans. Microw. Theory Tech
, vol.MTT-21
, Issue.12
, pp. 797-805
-
-
Heiter, G.1
-
2
-
-
0016316146
-
Automatic load contour mapping for microwave power transistors
-
Dec
-
J. Cusack, S. Perlow, and B. Perlman, "Automatic load contour mapping for microwave power transistors," IEEE Trans. Microw. Theory Tech. vol. MTT-22, no. 12, pp. 1146-1152, Dec. 1974.
-
(1974)
IEEE Trans. Microw. Theory Tech
, vol.MTT-22
, Issue.12
, pp. 1146-1152
-
-
Cusack, J.1
Perlow, S.2
Perlman, B.3
-
3
-
-
0017266794
-
Launcher and microstrip characterization
-
Dec
-
B. Bianco, M. Parodi, S. Ridella, and F. Selvaggi, "Launcher and microstrip characterization," IEEE Trans. Instrum. Meas., vol. IM-25, no. 4, pp. 320-323, Dec. 1976.
-
(1976)
IEEE Trans. Instrum. Meas
, vol.IM-25
, Issue.4
, pp. 320-323
-
-
Bianco, B.1
Parodi, M.2
Ridella, S.3
Selvaggi, F.4
-
4
-
-
0033322039
-
Robust SOLT and alternative calibrations for four-sampler vector network analyzers
-
Oct
-
J. Jargon, R. Marks, and D. Rytting, "Robust SOLT and alternative calibrations for four-sampler vector network analyzers," IEEE Trans. Microw. Theory Tech., vol. 47, no. 10, pp. 2008-2013, Oct. 1999.
-
(1999)
IEEE Trans. Microw. Theory Tech
, vol.47
, Issue.10
, pp. 2008-2013
-
-
Jargon, J.1
Marks, R.2
Rytting, D.3
-
5
-
-
85032425482
-
QSOLT: A new fast calibration algorithm for two-port s-parameter measurements
-
San Diego, CA, Dec
-
A. Ferrero and U. Pisani, "QSOLT: A new fast calibration algorithm for two-port s-parameter measurements," in 38th ARFTG Conf. Dig., San Diego, CA, Dec. 1991, pp. 15-24.
-
(1991)
38th ARFTG Conf. Dig
, pp. 15-24
-
-
Ferrero, A.1
Pisani, U.2
-
6
-
-
0026979136
-
Two-port network analyzer calibration using an unknown 'thru'
-
Dec
-
A. Ferrero and U. Pisani, "Two-port network analyzer calibration using an unknown 'thru'," IEEE Microw. Guided Wave Lett., vol. 2, no. 12, pp. 505-507, Dec. 1992.
-
(1992)
IEEE Microw. Guided Wave Lett
, vol.2
, Issue.12
, pp. 505-507
-
-
Ferrero, A.1
Pisani, U.2
-
7
-
-
0021389562
-
Computer-aided error correction of largesignal load-pull measurements
-
Mar
-
R. Tucker and P. Bradley, "Computer-aided error correction of largesignal load-pull measurements," IEEE Trans. Microw. Theory Tech., vol. MTT-32, no. 3, pp. 296-300, Mar. 1984.
-
(1984)
IEEE Trans. Microw. Theory Tech
, vol.MTT-32
, Issue.3
, pp. 296-300
-
-
Tucker, R.1
Bradley, P.2
-
8
-
-
0023670608
-
Improved error-correction technique for large-signal load-pull measurements
-
Nov
-
I. Hecht, "Improved error-correction technique for large-signal load-pull measurements," IEEE Trans. Microw. Theory Tech., vol. MTT-35, no. 11, pp. 1060-1062, Nov. 1987.
-
(1987)
IEEE Trans. Microw. Theory Tech
, vol.MTT-35
, Issue.11
, pp. 1060-1062
-
-
Hecht, I.1
-
9
-
-
0027585391
-
An improved calibration technique for on-wafer large-signal transistor characterization
-
Apr
-
A. Ferrero and U. Pisani, "An improved calibration technique for on-wafer large-signal transistor characterization," IEEE Trans. Instrum. Meas., vol. 47, no. 2, pp. 360-364, Apr. 1993.
-
(1993)
IEEE Trans. Instrum. Meas
, vol.47
, Issue.2
, pp. 360-364
-
-
Ferrero, A.1
Pisani, U.2
-
10
-
-
54949102458
-
New perspectives in non linear device and amplifier characterization
-
Milan, Italy, Sep
-
V. Teppati and A. Ferrero, "New perspectives in non linear device and amplifier characterization," in Proc. GAAS Conf., Milan, Italy, Sep. 2002.
-
(2002)
Proc. GAAS Conf
-
-
Teppati, V.1
Ferrero, A.2
-
11
-
-
36049048312
-
Recent improvements in realtime load-pull systems
-
Sorrento, Italy, Apr. 24-27
-
A. Ferrero, V. Teppati, and U. Pisani, "Recent improvements in realtime load-pull systems," in Proc. Instrum. Meas. Technol. Conf., Sorrento, Italy, Apr. 24-27, 2006, pp. 448-451.
-
(2006)
Proc. Instrum. Meas. Technol. Conf
, pp. 448-451
-
-
Ferrero, A.1
Teppati, V.2
Pisani, U.3
-
12
-
-
0037398783
-
A new class of nonuniform, broadband, nonsymmetrical rectangular coaxial-to-microstrip directional couplers for high power applications
-
Apr
-
V. Teppati and A. Ferrero, "A new class of nonuniform, broadband, nonsymmetrical rectangular coaxial-to-microstrip directional couplers for high power applications," IEEE Microw. Wireless Compon. Lett. vol. 13, no. 4, pp. 152-154, Apr. 2003.
-
(2003)
IEEE Microw. Wireless Compon. Lett
, vol.13
, Issue.4
, pp. 152-154
-
-
Teppati, V.1
Ferrero, A.2
-
13
-
-
33749259831
-
Active harmonic loadpull system for characterizing highly mismatched high power transistors
-
Long Beach, CA, Jun. 12-17
-
Z. Aboush, J. Lees, J. Benedikt, and P. Tasker, "Active harmonic loadpull system for characterizing highly mismatched high power transistors," in IEEE MTT-S Symp. Tech. Dig., Long Beach, CA, Jun. 12-17, 2005, pp. 1311-1314.
-
(2005)
IEEE MTT-S Symp. Tech. Dig
, pp. 1311-1314
-
-
Aboush, Z.1
Lees, J.2
Benedikt, J.3
Tasker, P.4
-
14
-
-
0020091250
-
Active load technique for load-pull characterization at microwave frequencies
-
Feb
-
G. P. Bava, U. Pisani, and V. Pozzolo, "Active load technique for load-pull characterization at microwave frequencies," Electron. Lett., vol. 18, no. 4, pp. 178-179, Feb. 1982.
-
(1982)
Electron. Lett
, vol.18
, Issue.4
, pp. 178-179
-
-
Bava, G.P.1
Pisani, U.2
Pozzolo, V.3
-
15
-
-
44049101380
-
Active load or source impedance synthesis apparatus for measurement test set of microwave components and systems,
-
U.S. Patent 6 509 743, Jan. 21
-
A. Ferrero, "Active load or source impedance synthesis apparatus for measurement test set of microwave components and systems," U.S. Patent 6 509 743, Jan. 21, 2003.
-
(2003)
-
-
Ferrero, A.1
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