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Volumn 381, Issue 3, 2008, Pages 211-215
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Nanoscale characterization of HT-9 exposed to lead bismuth eutectic at 550 °C for 3000 h
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ATOMIC PHYSICS;
ATOMIC SPECTROSCOPY;
ATOMS;
BISMUTH;
CHEMICAL PROPERTIES;
COOLANTS;
CRYSTALLOGRAPHY;
EUTECTICS;
FAST REACTORS;
LEAD;
MAGNETIC FORCE MICROSCOPY;
MAGNETIC PROPERTIES;
MICROSCOPIC EXAMINATION;
NEUTRON SOURCES;
NUCLEAR REACTORS;
SCANNING;
SCANNING PROBE MICROSCOPY;
STEEL;
ATOMIC FORCES;
BULK STEELS;
COLUMNAR STRUCTURES;
CONDUCTIVE;
CONDUCTIVE ATOMIC FORCE MICROSCOPIES;
CORROSION AND OXIDATIONS;
CORROSIVE MEDIUMS;
ENERGY DISPERSIVE;
GRAIN STRUCTURES;
HIGH-PERFORMANCE;
IRRADIATION PROPERTIES;
LEAD BISMUTHS;
LINE SCANS;
LOCAL PROPERTIES;
MAGNETIC FORCES;
NANO-SCALE CHARACTERIZATIONS;
OXIDE LAYERS;
PHYSICAL AND CHEMICAL PROPERTIES;
RADIATION ENVIRONMENTS;
SCANNING ELECTRONS;
SCANNING PROBE TECHNIQUES;
SPALLATION NEUTRON SOURCES;
STAINLESS STEEL;
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EID: 54949085373
PISSN: 00223115
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jnucmat.2008.03.018 Document Type: Article |
Times cited : (20)
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References (13)
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