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Volumn 39, Issue 11, 2008, Pages 1347-1348
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XRD, μ-Raman and optical absorption investigations of ZnO deposited by SILAR method
a
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Author keywords
Optical absorption; Raman; SILAR; Zinc oxide films
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Indexed keywords
ABSORPTION;
ADSORPTION;
AMMONIUM COMPOUNDS;
ELECTROMAGNETIC WAVE ABSORPTION;
ENERGY ABSORPTION;
LIGHT ABSORPTION;
METALLIC FILMS;
NITRATES;
SEMICONDUCTING ZINC COMPOUNDS;
STRUCTURAL ANALYSIS;
THICK FILMS;
X RAY ANALYSIS;
X RAY DIFFRACTION ANALYSIS;
ZINC;
ZINC ALLOYS;
ZINC OXIDE;
BAND GAPS;
GLASS SUBSTRATES;
NUMBER OF CYCLES;
OPTICAL ABSORPTION;
OPTICAL ABSORPTIONS;
RAMAN;
SILAR;
SUCCESSIVE IONIC LAYER ADSORPTION AND REACTIONS;
VIBRATION MODES;
X-RAY DIFFRACTIONS;
ZINC NITRATES;
ZINC OXIDE FILMS;
ZNO FILMS;
ZNO THIN FILMS;
OXIDE FILMS;
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EID: 54849441677
PISSN: 00262692
EISSN: None
Source Type: Journal
DOI: 10.1016/j.mejo.2008.01.057 Document Type: Article |
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Times cited : (15)
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References (5)
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