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Volumn 205, Issue 4, 2008, Pages 772-778
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N and k testing of magnetic heads with imaging spectroscopic ellipsometry
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINA SUBSTRATES;
ATOMIC FORCES;
CHEMICAL CONSTITUTIONS;
CONCENTRATION GRADIENTS;
DLC COATINGS;
GRANULAR STRUCTURES;
HARD DISKS;
IMAGING;
MAGNETIC;
MAGNETIC POLES;
METAL SUBSTRATES;
OPTICAL MODELS;
REGION OF INTERESTS;
ATOMIC FORCE MICROSCOPY;
CONCENTRATION (PROCESS);
ELLIPSOMETRY;
FRICTION;
MAGNETIC CORES;
MAGNETIC MATERIALS;
MAGNETIC RECORDING;
MICROSCOPIC EXAMINATION;
POLES;
SPECTROSCOPIC ELLIPSOMETRY;
SUBSTRATES;
SURFACE PROPERTIES;
SURFACE ROUGHNESS;
THICKNESS MEASUREMENT;
TITANIUM CARBIDE;
MAGNETIC HEADS;
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EID: 54849440633
PISSN: 18626300
EISSN: 18626319
Source Type: Journal
DOI: 10.1002/pssa.200777743 Document Type: Article |
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Times cited : (8)
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References (4)
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