EFLECH/INDEX - Another try of whole pattern indexing

Zeitschrift fur Kristallographie, Supplement

Volumn 1, Issue 26, 2007, Pages 197-202

  Bergmann, J ^a  

^a Ludwig Renn Allee 14   (Germany)

Author keywords

Full exhaustive; Indexing; Whole pattern; XRPD

Indexed keywords

EID: 54849432291     PISSN: 0930486X     EISSN: None     Source Type: Journal    
DOI: 10.1524/zksu.2007.2007.suppl_26.197     Document Type: Conference Paper

References (6)

1. Bergmann, J., Le Bail, A., Shirley, R. & Zlokazov, V., 2004, Z. Kristallogr., 219, 783.
2. Shirley, R., 1980, NBS Spec. Publ., 567, 361.
3. Werner, P.E., Erikson, L. & Westdahl, M., 1985, J. Appl. Cryst., 18, 367.
4. Kariuki, B.M., Belmonte, S.A., McMahon, M.I., Johnston, R.L., Harris, K.D.M. & Nelmes, R.J., 1999, J. Synchrotron Rad., 6 , 87.
5. Bergmann, J., Friedel, P. & Kleeberg, R., 1998, CPD Newsletter, 20, 5.
6. Bergmann, J., Kleeberg, R., Haase, A. & Breidenstein, B., 2000, Materials Science Forum, 347-349, 303.