Structural, electrical and optical analysis of ITO thin films prepared by sol-gel

Microelectronics Journal

Volumn 39, Issue 11, 2008, Pages 1356-1357

  Valencia, H Y ^a   Moreno, L C ^a   Ardila, A M ^a  

^a UNIVERSIDAD NACIONAL DE COLOMBIA   (Colombia)

Author keywords

Absorption coefficient; Average grain size; ITO; Resistance; Sol gel; Transmittance; Transparence conducting

Indexed keywords

ABSORPTION; COLLOIDS; ELECTRIC NETWORK ANALYSIS; ELECTRIC RESISTANCE; GELATION; GELS; GRAIN (AGRICULTURAL PRODUCT); GRAIN SIZE AND SHAPE; MICROSCOPIC EXAMINATION; SHEET RESISTANCE; SOL-GEL PROCESS; SOL-GELS; SOLAR ENERGY; SOLS; THICK FILMS; TIN; WINDOWS; X RAY ANALYSIS;

AVERAGE GRAIN SIZE; ITO; RESISTANCE; SOL-GEL; TRANSMITTANCE; TRANSPARENCE CONDUCTING;

FILM PREPARATION;

EID: 54849415073     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mejo.2008.01.036     Document Type: Article

References (4)

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