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Volumn 23, Issue 11, 2008, Pages 1529-1537
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Quantitative analysis of silicate certified reference materials by LA-ICPMS with and without an internal standard
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Author keywords
[No Author keywords available]
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Indexed keywords
ABLATION;
CALCIUM;
CHEMICAL ANALYSIS;
CHEMICAL ELEMENTS;
ELECTROMAGNETIC PULSE;
ELECTROMAGNETIC WAVES;
HIGH PERFORMANCE LIQUID CHROMATOGRAPHY;
HIGH PRESSURE LIQUID CHROMATOGRAPHY;
INDUCTIVELY COUPLED PLASMA;
INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY;
LASER ABLATION;
MASS SPECTROMETERS;
MASS SPECTROMETRY;
MINERALOGY;
PHOTORESISTS;
PULSED LASER DEPOSITION;
SILICA;
SILICATE MINERALS;
SILICATES;
SILICON;
STANDARDS;
STOICHIOMETRY;
TRACE ANALYSIS;
TRACE ELEMENTS;
ACCURATE;
ANALYTICAL TECHNIQUES;
CERTIFIED REFERENCE MATERIALS;
ELECTRON MICROPROBE;
ELEMENT CONCENTRATIONS;
INTERNAL STANDARDS;
QUANTITATIVE;
QUANTITATIVE ANALYSES;
SCALED OXIDES;
SCALING;
TRACE ELEMENT ANALYSES;
MINERALS;
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EID: 54849407402
PISSN: 02679477
EISSN: 13645544
Source Type: Journal
DOI: 10.1039/b801807n Document Type: Article |
Times cited : (80)
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References (36)
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