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Volumn 23, Issue 11, 2008, Pages 1529-1537

Quantitative analysis of silicate certified reference materials by LA-ICPMS with and without an internal standard

Author keywords

[No Author keywords available]

Indexed keywords

ABLATION; CALCIUM; CHEMICAL ANALYSIS; CHEMICAL ELEMENTS; ELECTROMAGNETIC PULSE; ELECTROMAGNETIC WAVES; HIGH PERFORMANCE LIQUID CHROMATOGRAPHY; HIGH PRESSURE LIQUID CHROMATOGRAPHY; INDUCTIVELY COUPLED PLASMA; INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY; LASER ABLATION; MASS SPECTROMETERS; MASS SPECTROMETRY; MINERALOGY; PHOTORESISTS; PULSED LASER DEPOSITION; SILICA; SILICATE MINERALS; SILICATES; SILICON; STANDARDS; STOICHIOMETRY; TRACE ANALYSIS; TRACE ELEMENTS;

EID: 54849407402     PISSN: 02679477     EISSN: 13645544     Source Type: Journal    
DOI: 10.1039/b801807n     Document Type: Article
Times cited : (80)

References (36)
  • 15
    • 84943008652 scopus 로고    scopus 로고
    • G. Plumlee, http://minerals.cr.usgs.gov/geo_chem_stand/, 1998
    • (1998)
    • Plumlee, G.1
  • 21
    • 84943008653 scopus 로고    scopus 로고
    • D. B. Smith, http://minerals.cr.usgs.gov/geo_chem_stand/, 1998
    • (1998)
    • Smith, D.B.1
  • 35
    • 54849405970 scopus 로고    scopus 로고
    • Unpub. PhD thesis, McGill University
    • J. E. Gagnon, Unpub. PhD thesis, McGill University, 2006
    • (2006)
    • Gagnon, J.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.