Occurrence of ferroelectricity in epitaxial BiMnO3 thin films

Microelectronics Journal

Volumn 39, Issue 11, 2008, Pages 1308-1310

  Grizalez, M ^a,d   Martinez, E ^b   Caicedo, J ^d   Heiras, J ^c   Prieto, P ^d  

^a UNIVERSIDAD DE LA AMAZONIA   (Colombia)

^b UNIVERSITY OF GUADALAJARA   (Mexico)

^c CENTRO DE CIENCIAS DE LA MATERIA CONDENSADA   (Mexico)

^d UNIVERSIDAD DEL VALLE   (Colombia)

Author keywords

Epitaxial thin films; Ferroelectricity; Multiferroic materials

Indexed keywords

BISMUTH COMPOUNDS; CHARACTERIZATION; CRYSTAL STRUCTURE; EPITAXIAL GROWTH; FERROELECTRICITY; MANGANESE COMPOUNDS; MANGANITES; PEROVSKITE; PEROVSKITE SOLAR CELLS; POLARIZATION; SINGLE CRYSTALS; STRONTIUM TITANATES; SUBSTRATES; TEMPERATURE MEASUREMENT; X RAY DIFFRACTION;

EPITAXIAL THIN FILMS; MULTIFERROIC MATERIALS; PEROVSKITE MANGANITES; QUANTITATIVE VALUES; R.F. MAGNETRON SPUTTERING; SATURATION POLARIZATION; SRTIO3 SUBSTRATES; X-RAY DIFFRACTION MEASUREMENTS;

THIN FILMS;

EID: 54849405515     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mejo.2008.01.023     Document Type: Article

References (6)

1. Schmid H. Ferroelectrics 162 665 (1994) 317
2. Hill N.A. J. Phys. Chem. B 104 (2000) 6694
3. Moreira dos Santos A., Cheetham A.K., Atou T., Syono Y., Yamaguchi Y., Ohoyama K., Chiba H., and Rao C.N.R. Phys. Rev. B 66 (2002) 064425
4. Moreira dos Santos A., Parashar S., Raju A.R., Zhao Y.S., Cheetham A.K., and Rao C.N.R. Solid State Commun. 122 (2002) 49
5. Sugawara F., and Iida S. J. Phys. Soc. Jpn. 20 (1965) 1529
6. Grizalez M., Delgado E., Gomez M.E., and Prieto P. Phys. Stat. Sol. (c) 4 11 (2007) 4203-4208