Analysis of multiple-scattering XAFS data using theoretical standards

Physica B: Physics of Condensed Matter

Volumn 208-209, Issue C, 1995, Pages 154-156

  Newville, M ^a   Ravel, B ^a   Haskel, D ^a   Rehr, J J ^a   Stern, E A ^a   Yacoby, Y ^b  

^a UNIVERSITY OF WASHINGTON   (United States)

^b HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 54749090787     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-4526(94)00655-F     Document Type: Article

References (8)