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Volumn 48, Issue 5-7, 2008, Pages 534-539

Influence of the Langmuir probe shaft on measuring plasma parameters

Author keywords

Electron density; Langmuir probes; Plasma diagnostics; Plasma parameters

Indexed keywords

ELECTRON DENSITY MEASUREMENT; ELECTRON TEMPERATURE; LANGMUIR PROBES; PLASMA DEVICES; PLASMA DIAGNOSTICS;

EID: 54549123346     PISSN: 08631042     EISSN: 15213986     Source Type: Journal    
DOI: 10.1002/ctpp.200810086     Document Type: Conference Paper
Times cited : (3)

References (12)
  • 2
    • 85153218573 scopus 로고    scopus 로고
    • B.E. Cherrington, Plasma Chem. and Plasma Processing, 2, 113-140 (1982).
    • B.E. Cherrington, Plasma Chem. and Plasma Processing, 2, 113-140 (1982).
  • 8
    • 85153201759 scopus 로고    scopus 로고
    • A.C. Breslin et al., Int. J. of Electron. 42, 433-442 (1977).
    • A.C. Breslin et al., Int. J. of Electron. 42, 433-442 (1977).
  • 12
    • 0040473441 scopus 로고    scopus 로고
    • H. Meyer et al., Phys Rev. E, 61, 4347-4356 (2000).
    • (2000) Phys Rev. E , vol.61 , pp. 4347-4356
    • Meyer, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.