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Volumn 78, Issue 4, 2008, Pages

Crack roughness in the two-dimensional random threshold beam model

Author keywords

[No Author keywords available]

Indexed keywords

GAUSSIAN BEAMS; PROBABILITY DISTRIBUTIONS; TWO DIMENSIONAL;

EID: 54549118265     PISSN: 15393755     EISSN: 15502376     Source Type: Journal    
DOI: 10.1103/PhysRevE.78.046105     Document Type: Article
Times cited : (23)

References (44)
  • 2
    • 33745062523 scopus 로고    scopus 로고
    • ADPHAH 0001-8732 10.1080/00018730300741518
    • M. J. Alava, P. K. V. V. Nukala, and S. Zapperi, Adv. Phys. ADPHAH 0001-8732 10.1080/00018730300741518 55, 349 (2006).
    • (2006) Adv. Phys. , vol.55 , pp. 349
    • Alava, M.J.1    Nukala, P.K.V.V.2    Zapperi, S.3
  • 7
  • 10
    • 0344288274 scopus 로고    scopus 로고
    • For a review see JCOMEL 0953-8984 10.1088/0953-8984/9/21/002
    • For a review see E. Bouchaud, J. Phys.: Condens. Matter JCOMEL 0953-8984 10.1088/0953-8984/9/21/002 9, 4319 (1997).
    • (1997) J. Phys.: Condens. Matter , vol.9 , pp. 4319
    • Bouchaud, E.1
  • 11
    • 0037319322 scopus 로고    scopus 로고
    • SRLEFH 0218-625X 10.1142/S0218625X03004676
    • E. Bouchaud, Surf. Rev. Lett. SRLEFH 0218-625X 10.1142/S0218625X03004676 10, 73 (2003).
    • (2003) Surf. Rev. Lett. , vol.10 , pp. 73
    • Bouchaud, E.1
  • 12
    • 32644464261 scopus 로고    scopus 로고
    • PRLTAO 0031-9007 10.1103/PhysRevLett.96.035506
    • L. Ponson, D. Bonamy, and E. Bouchaud, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.96.035506 96, 035506 (2006).
    • (2006) Phys. Rev. Lett. , vol.96 , pp. 035506
    • Ponson, L.1    Bonamy, D.2    Bouchaud, E.3
  • 16
  • 17
    • 4243435516 scopus 로고    scopus 로고
    • PLEEE8 1063-651X 10.1103/PhysRevE.57.6405
    • J. M. López and J. Schmittbuhl, Phys. Rev. E PLEEE8 1063-651X 10.1103/PhysRevE.57.6405 57, 6405 (1998).
    • (1998) Phys. Rev. e , vol.57 , pp. 6405
    • López, J.M.1    Schmittbuhl, J.2
  • 19
    • 45849154809 scopus 로고    scopus 로고
    • PLEEE8 1063-651X 10.1103/PhysRevE.71.026106
    • S. Zapperi, P. K. V. V. Nukala, and S. Simunovic, Phys. Rev. E PLEEE8 1063-651X 10.1103/PhysRevE.71.026106 71, 026106 (2005).
    • (2005) Phys. Rev. e , vol.71 , pp. 026106
    • Zapperi, S.1    Nukala, P.K.V.V.2    Simunovic, S.3
  • 20
    • 33746845239 scopus 로고    scopus 로고
    • PLEEE8 1063-651X 10.1103/PhysRevE.74.026105
    • P. K.V. V. Nukala, S. Zapperi, and S. Simunovic, Phys. Rev. E PLEEE8 1063-651X 10.1103/PhysRevE.74.026105 74, 026105 (2006).
    • (2006) Phys. Rev. e , vol.74 , pp. 026105
    • Nukala, P.K.V.V.1    Zapperi, S.2    Simunovic, S.3
  • 22
    • 34547889185 scopus 로고    scopus 로고
    • PRBMDO 0163-1829 10.1103/PhysRevB.76.054110
    • J. O. H. Bakke, T. Ramstad, and A. Hansen, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.76.054110 76, 054110 (2007).
    • (2007) Phys. Rev. B , vol.76 , pp. 054110
    • Bakke, J.O.H.1    Ramstad, T.2    Hansen, A.3
  • 27
    • 4243817004 scopus 로고
    • PRLTAO 0031-9007 10.1103/PhysRevLett.66.2476
    • A. Hansen, E. L. Hinrichsen, and S. Roux, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.66.2476 66, 2476 (1991).
    • (1991) Phys. Rev. Lett. , vol.66 , pp. 2476
    • Hansen, A.1    Hinrichsen, E.L.2    Roux, S.3
  • 30
    • 45849154809 scopus 로고    scopus 로고
    • PLEEE8 1063-651X 10.1103/PhysRevE.71.026106
    • S. Zapperi, P. K. V. V. Nukala, and S. Simunovic, Phys. Rev. E PLEEE8 1063-651X 10.1103/PhysRevE.71.026106 71, 026106 (2005).
    • (2005) Phys. Rev. e , vol.71 , pp. 026106
    • Zapperi, S.1    Nukala, P.K.V.V.2    Simunovic, S.3
  • 31
    • 0002586904 scopus 로고
    • FRACEG 0218-348X 10.1142/S0218348X93000101
    • J. Kertész, V. K. Horvath, and F. Weber, Fractals FRACEG 0218-348X 10.1142/S0218348X93000101 1, 67 (1993).
    • (1993) Fractals , vol.1 , pp. 67
    • Kertész, J.1    Horvath, V.K.2    Weber, F.3
  • 36
    • 33746137354 scopus 로고    scopus 로고
    • PRBMDO 0163-1829 10.1103/PhysRevB.74.014206
    • I. Malakhovsky, and M. A. J. Michels, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.74.014206 74, 014206 (2006).
    • (2006) Phys. Rev. B , vol.74 , pp. 014206
    • Malakhovsky, I.1    Michels, M.A.J.2
  • 37
    • 37649029506 scopus 로고    scopus 로고
    • PRLTAO 0031-9007 10.1103/PhysRevLett.87.125503
    • B. Skjetne, T. Helle, and A. Hansen, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.87.125503 87, 125503 (2001).
    • (2001) Phys. Rev. Lett. , vol.87 , pp. 125503
    • Skjetne, B.1    Helle, T.2    Hansen, A.3
  • 38
    • 38849181045 scopus 로고    scopus 로고
    • PRLTAO 0031-9007 10.1103/PhysRevLett.100.045501
    • J. O. H. Bakke and A. Hansen, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.100.045501 100, 045501 (2008).
    • (2008) Phys. Rev. Lett. , vol.100 , pp. 045501
    • Bakke, J.O.H.1    Hansen, A.2
  • 39
    • 0022152241 scopus 로고
    • JPSLBO 0302-072X 10.1051/jphyslet:019850046021099900
    • S. Roux and E. Guyon, J. Phys. (Paris), Lett. JPSLBO 0302-072X 10.1051/jphyslet:019850046021099900 46, 999 (1985).
    • (1985) J. Phys. (Paris), Lett. , vol.46 , pp. 999
    • Roux, S.1    Guyon, E.2
  • 40
    • 0001432695 scopus 로고
    • PRBMDO 0163-1829 10.1103/PhysRevB.39.637
    • H. J. Herrmann, A. Hansen, and S. Roux, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.39.637 39, 637 (1989).
    • (1989) Phys. Rev. B , vol.39 , pp. 637
    • Herrmann, H.J.1    Hansen, A.2    Roux, S.3
  • 41
    • 0242508326 scopus 로고    scopus 로고
    • JPHAC5 0305-4470 10.1088/0305-4470/36/45/004
    • P. K. V. V. Nukala and S. Simunovic, J. Phys. A JPHAC5 0305-4470 10.1088/0305-4470/36/45/004 36, 11403 (2003).
    • (2003) J. Phys. A , vol.36 , pp. 11403
    • Nukala, P.K.V.V.1    Simunovic, S.2
  • 43
    • 54549126431 scopus 로고    scopus 로고
    • As noted in Ref. for the fuse models, when the branching of the cracks or damage within the fracture process zone is not allowed thereby limiting the crack extension to only the crack tips, a local roughness exponent of 0.5 is obtained and there is no anomalous scaling. As soon as branching is allowed in this simplified RBM model, the value of the roughness exponent increases from ζloc =0.5 to ζloc 0.65.
    • As noted in Ref. for the fuse models, when the branching of the cracks or damage within the fracture process zone is not allowed thereby limiting the crack extension to only the crack tips, a local roughness exponent of 0.5 is obtained and there is no anomalous scaling. As soon as branching is allowed in this simplified RBM model, the value of the roughness exponent increases from ζloc =0.5 to ζloc 0.65.


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