Confinement effect in CdTe nanocrystals embedded in silica thin films

Physica Status Solidi (A) Applications and Materials Science

Volumn 205, Issue 6, 2008, Pages 1500-1504

  Levichev, S ^a   Rolo, A G ^a   Chahboun, A ^b   Conde, O ^c   Kovalev, A I ^d   Wainstein, D L ^d   Gomes, M J M ^a  

^a UNIVERSITY OF MINHO   (Portugal)

^b SIDI MOHAMED BEN ABDELLAH UNIVERSITY   (Morocco)

^c UNIVERSITY OF LISBON   (Portugal)

^d Surface Phenomena Researches Group LLC   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALED SAMPLES; BANDGAP; BLUE SHIFTS; CDTE NANOCRYSTALS; CDTE NANOPARTICLES; CONFINEMENT EFFECTS; GRADED INTERFACES; GRAZING INCIDENCES; GROWN SAMPLES; IN VACUUMS; LO PHONONS; OPTICAL; OPTICAL TRANSMITTANCES; PHOTO-LUMINESCENCE; PL EMISSIONS; SILICA MATRIXES; SILICA THIN FILMS; SIZE RANGING; SUBSEQUENT ANNEALING; X-RAY DIFFRACTIONS; X-RAY PHOTOELECTRON SPECTROSCOPIES;

ABSORPTION; ANNEALING; CADMIUM ALLOYS; CADMIUM COMPOUNDS; EMISSION SPECTROSCOPY; LIGHT EMISSION; LUMINESCENCE; MAGNETRON SPUTTERING; NANOCRYSTALLINE ALLOYS; NANOCRYSTALS; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; OXIDES; PHASE INTERFACES; PHOTOELECTRON SPECTROSCOPY; RAMAN SCATTERING; SEMICONDUCTING CADMIUM TELLURIDE; SILICA; SPECTRUM ANALYSIS; THICK FILMS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 54549106687     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200778134     Document Type: Conference Paper

References (25)

1. R. K. Jain and R. C. Lind, J. Opt. Soc. Am. 73, 647 (1983).
2. G. I. Stegeman and R. H. Stolen, J. Opt. Soc. Am. B 6, 652 (1987).
3. J. Yumoto, S. Fukushima, and K. Kubodera, Opt. Lett. 12, 832 (1987).
4. M. Y. Gao, S. Kirstein, H. Mohwald, A. L. Rogach, A. Kornowski, A. Eychmuller, and H. Weller, J. Phys. Chem. B 102, 8369 (1998).
5. X. Peng, M. C. Shlamp, A. V. Kadavanich, and A. P. Alivisatos, J. Am. Chem. Soc. 119, 7019 (1997).
6. B. G. Potter Jr. and J. H. Simmons, Phys. Rev. B 37, 10838 (1988).
7. A. G. Rolo, M. V. Stepikhova, S. A. Filonovich, C. Ricolleau, M. I. Vasilevskiy, and M. J. M. Gomes, phys. stat. sol. (b) 232, 44 (2002).
8. A. Chahboun, A. G. Rolo, S. A. Filonovich, and M. J. M. Gomes, Sol. Energy Mater. Sol. Cells 90, 1413 (2006).
9. D. Nesheva and Z. Levi, Semicond. Sci. Technol. 12, 1319 (1997).
10. Ying Wang, Zhiyong Tang, M. A. Correa-Duarte, Isabel Pastoriza-Santos, M. Giersig, N. A. Kotov, and L. M. Liz-Marzan, J. Phys. Chem. B 108, 15461 (2004).
11. V. Salgueirino-Maceira, M. A. Correa-Duarte, M. Spasova, L. M. Liz-Marzan, and M. Farle, Adv. Funct. Mater. 16, 509 (2006).
12. B. G. Potter Jr. and J. H. Simmons, J. Appl. Phys. 68, 1218 (1990).
13. S. N. Sharma, S. Kohli, and A. C. Rastogi, Physica E 25, 554 (2005).
14. B. G. Potter, Jr., J. H. Simmons, P. Kumar, and C. J. Stanton, J. Appl. Phys. 75, 8039 (1994).
15. Y. Wang and N. Herron, Phys. Rev. B 42, 7253 (1990).
16. JCPDS powder diffraction files, cubic CdTe-15-770.
17. A. M. de Paula, L. C. Barbosa, C. H. B. Cruz, O. L. Alves, J. A. Sanjurjo, and C. L. Cesar, Appl. Phys. Lett. 69, 357 (1996).
18. P. B. Dayal, B. R. Metha, Y. Aparna, and S. M. Shivaprasad, Appl. Phys. Lett. 81, 4254 (2002).
19. E. Lifshin, X-Ray Characterisation of Materials (Wiley-VCH, New York, 1999) p. 37.
20. J. M. Rowe, R. M. Nicklow, D. L. Price, and K. Zanio, Phys. Rev. B 10, 671 (1986).
21. I. H. Campbell and F. M. Fauchet, Solid State Commun. 58, 739 (1986).
22. D. J. Olego, P. M. Raccah, and J. P. Faurie, Phys. Rev. B 33, 3819 (1986).
23. O. R. Ochoa, E. J. Witkowski, C. Colajacomo, J. H. Sim-mons, and B. G. Potter, J. Mater. Sci. Lett. 16, 613 (1997).
24. Y. Kayanuma, Phys. Rev. B 38, 9797 (1988).
25. C. Q. Sun, B. K. Tay, Y. Q. Fu, S. Li, T. P. Chen, H. L. Bai, and E. Y. Jiang, J. Phys. Chem. B 107, 411 (2003).