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Volumn 41, Issue 10, 2008, Pages 1105-1112

Variability sources of DC voltage-current measurements in the study of TiO2-based varistors

Author keywords

Electronic ceramics; Low voltage varistors; Metrology; TiO2; Traceability

Indexed keywords

BUILDING MATERIALS; CERAMIC MATERIALS; CHROMIUM; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENT MEASUREMENT; ELECTRIC PROPERTIES; ELECTRIC RESISTANCE; SINTERING; TANTALUM; TITANIUM; TITANIUM DIOXIDE; VARISTORS;

EID: 54549095059     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.measurement.2008.03.006     Document Type: Article
Times cited : (16)

References (17)
  • 10
    • 54549084110 scopus 로고    scopus 로고
    • INMETRO/SENAI. Vocabulário Internacional de termos fundamentais e gerais de metrologia - VIM, second ed., Brasi{dotless}́lia, Brazil, 2000.
    • INMETRO/SENAI. Vocabulário Internacional de termos fundamentais e gerais de metrologia - VIM, second ed., Brasi{dotless}́lia, Brazil, 2000.
  • 11
    • 54549096625 scopus 로고    scopus 로고
    • ISO (International Organization for Standardization), ISO GUM: Guide to the Expression of Uncertainty in Measurement, first ed. 1993 (corrected and reprinted, 1995), p. 91.
    • ISO (International Organization for Standardization), ISO GUM: Guide to the Expression of Uncertainty in Measurement, first ed. 1993 (corrected and reprinted, 1995), p. 91.
  • 12
    • 54549121141 scopus 로고    scopus 로고
    • Web sites of the Brazilian government agencies of BIPM (http://www.bipm.fr) and INMETRO ().
    • Web sites of the Brazilian government agencies of BIPM (http://www.bipm.fr) and INMETRO ().
  • 13
    • 0014553750 scopus 로고    scopus 로고
    • M.I. Mendelson, Average grain size in polycrystalline ceramics. J. Am. Ceram. Soc. 8, 52, 443, 1969.
    • M.I. Mendelson, Average grain size in polycrystalline ceramics. J. Am. Ceram. Soc. 8, 52, 443, 1969.
  • 14
    • 54549094503 scopus 로고    scopus 로고
    • ISO/IEC 17025:2001, Technical Requirements for the competence of laboratories.
    • ISO/IEC 17025:2001, Technical Requirements for the competence of laboratories.
  • 15
    • 54549092283 scopus 로고    scopus 로고
    • Y. Tang, Voltage Metrology at NIST-Past, Present and Future, 5th International Seminar of Electric Metrology, Rio de Janeiro, April 2002.
    • Y. Tang, Voltage Metrology at NIST-Past, Present and Future, 5th International Seminar of Electric Metrology, Rio de Janeiro, April 2002.
  • 17
    • 54549098868 scopus 로고    scopus 로고
    • INMETRO/ABNT/SBM/RHMetrologia, Expressão da incerteza de medição na calibração, 1a. edição brasileira do EA-4/02 - Expression of uncertainty of measurement in calibration, Rio de Janeiro, 1999.
    • INMETRO/ABNT/SBM/RHMetrologia, Expressão da incerteza de medição na calibração, 1a. edição brasileira do EA-4/02 - Expression of uncertainty of measurement in calibration, Rio de Janeiro, 1999.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.