A method of steel strip image segmentation based on local gray information

Proceedings of the IEEE International Conference on Industrial Technology

Volumn , Issue , 2008, Pages

  Shui Shan, Yang ^a   Yong hui, He ^b   Zhen long, Wang ^a   Wan sheng, Zhao ^a  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

^b BAOSTEEL RESEARCH INSTITUTE   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; IMAGE PROCESSING; IMAGE SEGMENTATION; STEEL; STRIP METAL; SWITCHING CIRCUITS;

DEFECT IMAGES; GRAY DISTRIBUTIONS; GRAY INFORMATIONS; GRAY LEVEL DISTRIBUTIONS; GRAY LEVELS; LOCAL DEFECTS; MEAN-VALUE; REGION OF INTERESTS; SEGMENTATION RESULTS; STEEL STRIPT; STRIP SURFACES;

SURFACE DEFECTS;

EID: 54549094975     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICIT.2008.4608646     Document Type: Conference Paper

References (7)

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