One-dimensional axial simulation of electric double layer overlap effects in devices combining micro- and nanochannels

Microfluidics and Nanofluidics

Volumn 5, Issue 6, 2008, Pages 761-774

  Hughes, Brice T ^a   Berg, Jordan M ^a   James, Darryl L ^a   Ibraguimov, Akif ^b   Liu, Shaorong ^c   Temkin, Henryk ^a  

^a Department of Electrical and Computer Engineering   (United States)

^b TEXAS TECH UNIVERSITY   (United States)

^c UNIVERSITY OF OKLAHOMA   (United States)

Author keywords

Continuation methods; Electric double layer overlap; Electrokinetic flow; Ion transport; Numerical modeling; Poisson Nernst Planck equations; Scale transition; Singular perturbation

Indexed keywords

CHARGE DENSITY; CONCENTRATION (PROCESS); ELECTROCHEMISTRY; IONS; NANOFLUIDICS; NUMERICAL METHODS; PARAMETER ESTIMATION; TWO DIMENSIONAL;

CONTINUATION METHODS; ELECTRIC DOUBLE LAYER OVERLAP; ELECTROKINETIC FLOW; ION TRANSPORT; NUMERICAL MODELING; POISSON-NERNST-PLANCK EQUATIONS; SCALE TRANSITION; SINGULAR PERTURBATION;

MODEL STRUCTURES;

EID: 54549087782     PISSN: 16134982     EISSN: 16134990     Source Type: Journal    
DOI: 10.1007/s10404-008-0288-2     Document Type: Article

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