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Volumn 78, Issue 13, 2008, Pages

Memory effects in transport through a hopping insulator: Understanding two-dip experiments

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EID: 54449096583     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.78.132201     Document Type: Article
Times cited : (19)

References (23)
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